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(1990, July) Surface and Interface Analysis Vol. 16 (1) Wiley

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Reference TypeJournal (issue)
JournalSurface and Interface Analysis
Year1990 (July)Volume16
Issue1
PublisherWiley
Mindat Ref. ID6502696Long-form Identifiermindat:1:5:6502696:8
GUID0
Full Reference(1990, July) Surface and Interface Analysis Vol. 16 (1) Wiley
Plain Text(1990, July) Surface and Interface Analysis Vol. 16 (1) Wiley
In(n.d.) Surface and Interface Analysis Vol. 16. Wiley

Contains

(1990) Masthead. Surface and Interface Analysis, 16 (1). doi:10.1002/sia.740160101
Briggs, D. (1990) Preface/Editorial. Surface and Interface Analysis, 16 (1). doi:10.1002/sia.740160102
Werner, H. W. (1990) Opening speech. Surface and Interface Analysis, 16 (1). doi:10.1002/sia.740160103
Leggett, G. J., Vickerman, J. C., Briggs, D. (1990) Applications of tandem quadrupole mass spectrometry in SIMS. Surface and Interface Analysis, 16 (1). 3-8 doi:10.1002/sia.740160104
Migeon, H. N., Schuhmacher, M., Slodzian, G. (1990) Analysis of insulating specimens with the Cameca IMS4f. Surface and Interface Analysis, 16 (1). 9-13 doi:10.1002/sia.740160105
Lozzi, L., Passacantando, M., Picozzi, P., Santucci, S., Diociaiuti, M., Paoletti, L. (1990) Structural characterization of supported chromium clusters by extended energy-loss fine structure. Surface and Interface Analysis, 16 (1). 14-17 doi:10.1002/sia.740160106
Xu, N. S., Sullivan, J. L. (1990) Helium ion and fast atom scattering from polycrystalline copper surfaces. Surface and Interface Analysis, 16 (1). 18-24 doi:10.1002/sia.740160107
Pchelyakov, O. P., Sokolov, L. V. (1990) Oscillations in the optical characteristics of Ge films during MBE by automatic ellipsometry. Surface and Interface Analysis, 16 (1). 25 doi:10.1002/sia.740160108
Pigeat, P., Pacia, N., Yuen, G. Sum, Weber, B. (1990) Emissivity as a method of thin film analysis. Surface and Interface Analysis, 16 (1). 25-26 doi:10.1002/sia.740160109
Kuiper, A. E. T. (1990) RBS and ERD analysis of semiconductor device materials. Surface and Interface Analysis, 16 (1). 29-35 doi:10.1002/sia.740160110
Gao, Y., Godefroy, S., Benchimol, J. L., Alaoui, F., Alexandre, F., Rao, K. (1990) SIMS analysis of InP, GaAs and InGaAs layers grown by chemical beam epitaxy. Surface and Interface Analysis, 16 (1). 36-40 doi:10.1002/sia.740160111
Cassette, S., Plais, F., Olivier, J. (1990) Surface analysis to study the improvements of silicon nitride/gallium arsenide interface properties. Surface and Interface Analysis, 16 (1). 41-45 doi:10.1002/sia.740160112
Ohlídal, Ivan, Líbezný, Milan (1990) Immersion ellipsometry of semiconductor surfaces. Surface and Interface Analysis, 16 (1). 46-53 doi:10.1002/sia.740160113
Gruzza, B., Pariset, C., Abdellaoui, S. (1990) An ELS and AES study of InP(100) surfaces during Sb atom condensation. Surface and Interface Analysis, 16 (1). 54-58 doi:10.1002/sia.740160114
Valeri, S., Lolli, M. (1990) AES, EELS and XPS study of ion-induced GaAs and InP(110) surface and subsurface modifications. Surface and Interface Analysis, 16 (1). 59-64 doi:10.1002/sia.740160115
Carin, R., Deville, J. P., Werckmann, J. (1990) An XPS study of GaN thin films on GaAs. Surface and Interface Analysis, 16 (1). 65-69 doi:10.1002/sia.740160116
Bishop, H. E., Greenwood, S. J. (1990) SIMS of microelectronic structures using a liquid metal ion gun. Surface and Interface Analysis, 16 (1). 70-76 doi:10.1002/sia.740160117
Dinges, H. W., Kempf, B., Burkhard, H. (1990) Determination of sputter damage on InP by MAI ellipsometry. Surface and Interface Analysis, 16 (1). 77-81 doi:10.1002/sia.740160118
Tyrrell, G. C., Boyd, I. W., Jackman, R. B. (1990) Ion-beam enhanced reactions at the silicon-bromine interface: Application to electronic materials processing. Surface and Interface Analysis, 16 (1). 83-84 doi:10.1002/sia.740160119
Ichinokawa, T. (1990) Surface analytical scanning electron microscopy in ultrahigh vacuum combined with scanning tunnelling microscopy. Surface and Interface Analysis, 16 (1). 87-96 doi:10.1002/sia.740160120
Gómez-Rodríguez, J. M., Vázquez, L., Baró, A. M. (1990) Application of an STM/SEM instrument for the study of materials: Tip effects and data correlation. Surface and Interface Analysis, 16 (1). 97-104 doi:10.1002/sia.740160121
Nomura, S., Shichi, H., Mitani, E., Izumi, E. (1990) A new SIMS instrument for submicron microarea analysis. Surface and Interface Analysis, 16 (1). 105-108 doi:10.1002/sia.740160122
De Crescenzi, M., Derrien, J., Lozzi, L., Picozzi, P., Santucci, S. (1990) Short-range-order investigation by low-energy electrons. Surface and Interface Analysis, 16 (1). 111-117 doi:10.1002/sia.740160123
Bishop, H. E. (1990) The influence of diffraction effects on quantitative Auger electron spectroscopy. Surface and Interface Analysis, 16 (1). 118-128 doi:10.1002/sia.740160124
Rivière, J. C., Crossley, J. A. A. (1990) The effect of hydrogen content on silicon coordination in silicon oxynitrides: An Auger parameter study. Surface and Interface Analysis, 16 (1). 129-134 doi:10.1002/sia.740160125
Seah, M. P. (1990) VAMAS surface chemical analysis technical working party—an overview of project objectives, progress and the requirements for further work. Surface and Interface Analysis, 16 (1). 135-139 doi:10.1002/sia.740160126
Yoshihara, K., Shimizu, R., Homma, T., Tokutaka, H., Goto, K., Fujita, D., Kurokawa, A., Ichimura, S., Kurahashi, M., Kudo, M., Hashiguchi, Y., Suzuki, T., Ohmura, T., Soeda, F., Tanaka, K., Tanaka, A., Sekine, T., Shiokawa, Y., Hayashi, T. (1990) The reliability of quantitative analysis with AES. Surface and Interface Analysis, 16 (1). 140-143 doi:10.1002/sia.740160127
Smith, G. C., Seah, M. P. (1990) Standard reference spectra for XPS and AES: Their derivation, validation and use. Surface and Interface Analysis, 16 (1). 144-148 doi:10.1002/sia.740160128
Gries, W. H., Werner, W. (1990) Take-off angle and film thickness dependences of the attenuation length of X-ray photoelectrons by a trajectory reversal method. Surface and Interface Analysis, 16 (1). 149-153 doi:10.1002/sia.740160129
Xu, N. S., Pearce, C. G., Sullivan, J. L. (1990) A time-of-flight study of water molecular ion and neutral scattering from copper surfaces. Surface and Interface Analysis, 16 (1). 154-158 doi:10.1002/sia.740160130
Moretti, G. (1990) The Auger parameter and the polarization energy: A simple electrostatic model. Surface and Interface Analysis, 16 (1). 159-162 doi:10.1002/sia.740160131
Fitzgerald, A. G., Gillies, A. D., Watton, H. L. L. (1990) A comparison of the composition of thin films on substrates determined by EDX and surface analysis. Surface and Interface Analysis, 16 (1). 163-167 doi:10.1002/sia.740160132
Seah, M. P., Smith, G. C. (1990) Quantitative AES: Calibration of spectrometers for true spectral measurements—results of a VAMAS round robin and recommendations for acquiring reference data banks. Surface and Interface Analysis, 16 (1). 168-172 doi:10.1002/sia.740160133
Jansson, C., Tougaard, S. (1990) Influence of the inelastic background on the accuracy of factor analysis of electron spectra. Surface and Interface Analysis, 16 (1). 173-177 doi:10.1002/sia.740160134
Palacio, C., Mathieu, H. J. (1990) Application of factor analysis to the AES and XPS study of the oxidation of chromium. Surface and Interface Analysis, 16 (1). 178-182 doi:10.1002/sia.740160135
Fujita, D., Tanaka, A., Goto, K., Homma, T. (1990) NiCo alloy as a new reference material for quantitative surface analysis. Surface and Interface Analysis, 16 (1). 183-187 doi:10.1002/sia.740160136
Dubot, P., Barthés-Labrousse, M. G., Langeron, J. P. (1990) Determination of ultrathin film growth modes using inelastic Auger electrons: Sm/Cr (211). Surface and Interface Analysis, 16 (1). 188-192 doi:10.1002/sia.740160137
Soriano, L., Galan, L., Rueda, F. (1990) An XPS study of Cs2Te photocathode materials. Surface and Interface Analysis, 16 (1). 193-198 doi:10.1002/sia.740160138
Jørgensen, B., Morgen, P. (1990) Quantitative surface analysis (AES) of SiC. Surface and Interface Analysis, 16 (1). 199-202 doi:10.1002/sia.740160139
Valamontes, E., Nassiopoulos, A. G., Glezos, N. (1990) Back-scattering and X-ray-induced correction factors for AES of thin overlayers: Influence on lateral resolution. Surface and Interface Analysis, 16 (1). 203-208 doi:10.1002/sia.740160140
Repoux, M., Darque-Ceretti, E., Casamassima, M., Contour, J. P. (1990) Determination of the intensity-energy response function of the ISA Riber MAC 2 electron analyser. Surface and Interface Analysis, 16 (1). 209-212 doi:10.1002/sia.740160141
Elizalde, E., Sanz, J. M., Yubero, F., Galán, L. (1990) Determination of optical constants of ZrO2 and Zr by electron energy-loss spectroscopy. Surface and Interface Analysis, 16 (1). 213-214 doi:10.1002/sia.740160142
Vam, L. Pham, Gautier, M., Duraud, J. P., Gillet, F., Jollet, F. (1990) An XPS, EELS and LEED study of monocrystalline Al2O3 (0001) surfaces: Modifications induced by heat treatment or ion bombardment. Surface and Interface Analysis, 16 (1). 214-215 doi:10.1002/sia.740160143
Kövér, L., Cserny, I., Fišer, M., Brabec, V., Dragoun, O., Novák, J. (1990) Combined application of ICES and XPS methods for quantitative electron spectroscopy of Tc compounds. Surface and Interface Analysis, 16 (1). 215-216 doi:10.1002/sia.740160144
van der Wel, H., Ponjeé, J. J., van Vroonhoven, F. C. B. M., van Velzen, P. N. T. (1990) Surface analysis of monomolecular layers with time-of-flight SIMS. Surface and Interface Analysis, 16 (1). 216-217 doi:10.1002/sia.740160145
Plassa, M., Calcatelli, A., Bergoglio, M. (1990) Studies of the surface of mass standards. Surface and Interface Analysis, 16 (1). 218 doi:10.1002/sia.740160146
Avakov, A. S., Tsipinyuk, B. A. (1990) Efficiencies of registration of ions with electron multipliers in SIMS and SNMS surface analysis. Surface and Interface Analysis, 16 (1). 219 doi:10.1002/sia.740160147
Fousse, D. (1990) Tin-iron quantitative determination on steel. Surface and Interface Analysis, 16 (1). 220-221 doi:10.1002/sia.740160148
Kurbatov, G. G., Zaporozchenko, V. I. (1990) The calibration of electron spectrometer intensity-energy response functions. Surface and Interface Analysis, 16 (1). 221-223 doi:10.1002/sia.740160149
Watts, J. F., Blunden, R. A., Hall, T. J. (1990) The failure mode of adhesively bonded aluminium following aqueous exposure. Surface and Interface Analysis, 16 (1). 227-235 doi:10.1002/sia.740160150
Thorne, N. A., Thuéry, P., Frichet, A., Gimenez, P., Sartre, A. (1990) Hydration of oxide films on aluminium and its relation to polymer adhesion. Surface and Interface Analysis, 16 (1). 236-240 doi:10.1002/sia.740160151
André, V., Arefi, F., Amouroux, J., Lorang, G. (1990) Influence of plasma pretreatment of polypropylene on the adhesion with aluminium: An Auger spectroscopic study. Surface and Interface Analysis, 16 (1). 241-245 doi:10.1002/sia.740160152
Nitschké, F. (1990) The interface chemistry of phenolic and epoxy adhesives with a model aluminium surface. Surface and Interface Analysis, 16 (1). 247 doi:10.1002/sia.740160153
Phuku, P., Bertrand, P., De Puydt, Y. (1990) Relation between adhesion, microstructure and composition of thermally evaporated Al thin films on PET. Surface and Interface Analysis, 16 (1). 248-249 doi:10.1002/sia.740160154
van der Wijk, A., Werner, H. W. (1990) Diagnostic techniques for failure analysis and reliability evaluation in VLSI technology. Surface and Interface Analysis, 16 (1). 253-262 doi:10.1002/sia.740160155
Eickmans, J., Holm, R., Müller, G., Horn, E.-M., Droste, R. (1990) Surface and microanalytical studies on the corrosion of a Ti5Ta alloy in concentrated nitric acid. Surface and Interface Analysis, 16 (1). 265-270 doi:10.1002/sia.740160156
Hoppe, H.-W., Strehblow, H.-H. (1990) XPS and UPS examinations of Fe53Ni and Fe10Ni in 1M NaOH and 0.005M H2SO4. Surface and Interface Analysis, 16 (1). 271-277 doi:10.1002/sia.740160157
Volmer, M., Stratmann, M., Viefhaus, H. (1990) Electrochemical and electron spectroscopic investigations of iron surfaces modified with thiols. Surface and Interface Analysis, 16 (1). 278-282 doi:10.1002/sia.740160158
Traisnel, M., Elachab, M., Gengembre, L., Leroy, J. M. (1990) Influence of nickel on the behaviour of superferritic 290 Mo alloys in sulphuric and hydrochloric acid media: XPS, AES and electrochemical studies. Surface and Interface Analysis, 16 (1). 283-288 doi:10.1002/sia.740160159
Lenglet, M., Machefert, J. M., Claude, J. M., Lefez, B., Lopitaux, J., D'Huysser, A. (1990) Study of the large non-stoichiometry of copper(I) oxide on oxidized copper (T < 573 K,pO2 = 0.21 atm). Surface and Interface Analysis, 16 (1). 289-292 doi:10.1002/sia.740160160
Greyling, C. J., Kotzé, I. A., Viljoen, P. E. (1990) The kinetics of oxide film growth on Maraging steel as described by space-charge effects. Surface and Interface Analysis, 16 (1). 293-298 doi:10.1002/sia.740160161
Arfelli, M., Ingo, G. M., Mattogno, G., Beccaria, A. M. (1990) XPS investigation on the corrosion behaviour of nickel in sea water. Surface and Interface Analysis, 16 (1). 299-303 doi:10.1002/sia.740160162
Morant, C., Galán, L., Sanz, J. M. (1990) An XPS study of the initial stages of oxidation of hafnium. Surface and Interface Analysis, 16 (1). 304-308 doi:10.1002/sia.740160163
Siemensmeyer, B., Schultze, J. W. (1990) XPS and UPS studies of gas-phase oxidation, electrochemistry and corrosion behaviour of Ti and Ti5Ta. Surface and Interface Analysis, 16 (1). 309-314 doi:10.1002/sia.740160164
Thorne, N. A., Jugnet, Y., Reboul, M., Dunlop, H. (1990) Comparison of the natural oxide films formed on Mg and its alloys. Surface and Interface Analysis, 16 (1). 315 doi:10.1002/sia.740160165
Dezerville, P., Lenglet, M., Arsene, B., Leterrible, P., Welter, J. M. (1990) Inhibition of copper oxidation by polyvinylimidazole. Surface and Interface Analysis, 16 (1). 315-317 doi:10.1002/sia.740160166
Malitesta, C., Sabbatini, L., Zambonin, P. G. (1990) XPS in the investigation of electrode surfaces: Analytical characterization of the CuO cathode in the Li/CuO cell. Surface and Interface Analysis, 16 (1). 317-318 doi:10.1002/sia.740160167
Gries, W. H., Koschig, W. (1990) Determination of the centroid depths of the depth profiles of ion-implanted analytes by angle-resolved electron microbeam analysis. Surface and Interface Analysis, 16 (1). 321-324 doi:10.1002/sia.740160168
Lorang, G., Jallerat, N., Quang, K. Vu, Langeron, J.-P. (1990) AES depth profiling of passive overlayers formed on nickel alloys. Surface and Interface Analysis, 16 (1). 325-330 doi:10.1002/sia.740160169
Wagner, W., Rauch, F., Ottermann, C., Bange, K. (1990) In-depth profiling of hydrogen in oxidic multilayer systems. Surface and Interface Analysis, 16 (1). 331-334 doi:10.1002/sia.740160170
Zalar, A., Hofmann, S. (1990) Determination of depth resolution parameters from AES sputtering profiles of multilayer structures with varying single layer thicknesses. Surface and Interface Analysis, 16 (1). 335-336 doi:10.1002/sia.740160171
Barbier, B., Auvray, M. H., Landesman, J. P., Villatte, M., Desarmot, G. (1990) XPS and SIMS studies of amino groups electrochemically grafted on carbon fibre surfaces. Surface and Interface Analysis, 16 (1). 336-337 doi:10.1002/sia.740160172
Dauscher, A, Hilaire, L., Le Normand, F., Müller, W., Maire, G., Vasquez, A. (1990) Characterization by XPS and XAS of supported Pt/TiO2CeO2 catalysts. Surface and Interface Analysis, 16 (1). 341-346 doi:10.1002/sia.740160173
Loggenberg, P. M., Dry, M. E., Copperthwaite, R. G. (1990) A surface study of the CO hydrogenation reaction on fused iron catalysts. Surface and Interface Analysis, 16 (1). 347-351 doi:10.1002/sia.740160174
Moretti, G., Anichini, A., Fierro, G., Lo Jacono, M., Porta, P. (1990) Surface characterization of Cux/2Cd1−xIn2+x/2S4 model catalysts. Surface and Interface Analysis, 16 (1). 352-358 doi:10.1002/sia.740160175
Aas, N., Sakakini, B. H., West, R. H., Vickerman, J. C. (1990) The preparation and characterization of a model supported ruthenium catalyst. Surface and Interface Analysis, 16 (1). 359-363 doi:10.1002/sia.740160176
Merlen, E., Lynch, J., Bisiaux, M., Raatz, F. (1990) Surface modifications during Y zeolite dealumination. Surface and Interface Analysis, 16 (1). 364-368 doi:10.1002/sia.740160177
Drawdy, Jean E., Hoflund, Gar B., Gardner, Steven D., Yngvadottir, Eva, Schryer, David R. (1990) Effect of pretreatment on a platinized tin oxide catalyst used for low-temperature Co oxidation. Surface and Interface Analysis, 16 (1). 369-374 doi:10.1002/sia.740160178
Gonzalez-Elipe, A. R., Munuera, G., Espinos, J. P. (1990) XPS intensities and binding energy shifts as metal dispersion parameters in Ni/SiO2 catalysts. Surface and Interface Analysis, 16 (1). 375-379 doi:10.1002/sia.740160179
Ackelid, U., Fogelberg, J., Petersson, L.-G. (1990) A reaction cell for studies of catalytic surfaces: Ammonia blocking of water production on platinum in hydrogen/oxygen atmospheres. Surface and Interface Analysis, 16 (1). 381 doi:10.1002/sia.740160180
Lappalainen, R., Yang, E-L., Hirvonen, J.-P. (1990) Application of nuclear methods to the study of transfer wear of PTFE on stainless steel and silicon. Surface and Interface Analysis, 16 (1). 385-389 doi:10.1002/sia.740160181
Mosbah, Michelle, Gosset, James, Trocellier, Patrick, Puig, T., Cantarel, M., Condat, M. (1990) Nuclear microprobe characterization of surface hardening by precipitation of chromium carbides after laser beam treatment of a NiCr substrate. Surface and Interface Analysis, 16 (1). 390-396 doi:10.1002/sia.740160182
Yamamoto, S., Kawaguchi, Y., Hashimoto, H. (1990) Exoelectron-Microscopic observations of mechanically damaged surfaces. Surface and Interface Analysis, 16 (1). 397-398 doi:10.1002/sia.740160183
Kessel, R., Schultze, J. W. (1990) Surface analytical and photoelectrochemical investigations of conducting polymers. Surface and Interface Analysis, 16 (1). 401-406 doi:10.1002/sia.740160184
Marletta, Giovanni, Catalano, Salvatore M., Pignataro, Salvatore (1990) Chemical reactions induced in polymers by keV ions, electrons and photons. Surface and Interface Analysis, 16 (1). 407-411 doi:10.1002/sia.740160185
Morra, M., Occhiello, E., Garbassi, F. (1990) Surface characterization of plasma-treated PTFE. Surface and Interface Analysis, 16 (1). 412-417 doi:10.1002/sia.740160186
Nowak, S., Haerri, H.-P., Schlapbach, L., Vogt, J. (1990) Surface analysis and adhesion of polypropylene after low-pressure plasma treatment. Surface and Interface Analysis, 16 (1). 418-423 doi:10.1002/sia.740160187
Viel, P., Deniau, G., Lecayon, G., Le Gressus, C. (1990) Spectroscopic studies of a metallic surface modification by grafting and growth of a polymeric film. Surface and Interface Analysis, 16 (1). 425-426 doi:10.1002/sia.740160188
Gaillard, F., Romand, M. (1990) Application of X-ray emission spectrometry (LEEIXS) to the study of insulator surface—molecular characterization of some metallic oxides or compounds. Surface and Interface Analysis, 16 (1). 429-434 doi:10.1002/sia.740160189
Nonaka, H., Ichimura, S., Arai, K., Le Gressus, C. (1990) Defect formation observed by AES in a-SiO2 films prepared by photochemical vapour deposition. Surface and Interface Analysis, 16 (1). 435-439 doi:10.1002/sia.740160190
Guimon, C., Gonbeau, D., Pfister-Guillouzo, G., Dugne, O., Guette, A., Naslain, R., Lahaye, M. (1990) XPS study of BN thin films deposited by CVD on SiC plane substrates. Surface and Interface Analysis, 16 (1). 440-445 doi:10.1002/sia.740160191
Conard, T., Vohs, J. M., Thiry, P. A., Caudano, R. (1990) AES and HREELS studies of the Cu/MgO(100) interface. Surface and Interface Analysis, 16 (1). 446-451 doi:10.1002/sia.740160192
Arfelli, M., Ingo, G. M., Mattogno, G. (1990) XPS investigation of impurity phase segregation in 25.5 wt.% CeO2−2.5 Y2O3−72 ZrO2 plasma-sprayed thermal barrier coatings. Surface and Interface Analysis, 16 (1). 452-456 doi:10.1002/sia.740160193
Daolio, S., Facchin, B., Pagura, C., De Battisti, A., Battaglin, G. (1990) Mixed-Oxide electrode study by secondary ion mass spectrometry. Surface and Interface Analysis, 16 (1). 457-460 doi:10.1002/sia.740160194
Gillet, E., Ealet, B., Berlioz, J. L. (1990) Electronic structure of metal-sapphire interfaces. Surface and Interface Analysis, 16 (1). 461-466 doi:10.1002/sia.740160195
Gautier, M., Thromat, N., Duraud, J. P., Le Gressus, C., Henriot, M., Liang, K., Orange, G., Fantozzi, G. (1990) Influence of surface defects on the mechanical properties of yttria ceramics. Surface and Interface Analysis, 16 (1). 467-468 doi:10.1002/sia.740160196
Desimoni, E., Casella, G. I., Morone, A., Salvi, A. M. (1990) XPS/SEM characterization of surface-treated carbon fibres. Surface and Interface Analysis, 16 (1). 468-469 doi:10.1002/sia.740160197
Seibt, E. W., Zalar, A. (1990) AES studies of surface and interfacial modifications in annealed metallic overlayered high-Tc superconductors. Surface and Interface Analysis, 16 (1). 469-470 doi:10.1002/sia.740160198
Lynch, J., Rahbari, R., Lee, L. T., Bisiaux, M., Lecourtier, J., Chauveteau, G. (1990) XPS study of ion adsorption on siliceous surfaces. Surface and Interface Analysis, 16 (1). 471 doi:10.1002/sia.740160199
Atabaev, B. G., Besedina, E. A., Kareev, M. S., Dzabbarganov, R. (1990) Electron-stimulated desorption, secondary emission and charging of ionic crystals. Surface and Interface Analysis, 16 (1). 475-479 doi:10.1002/sia.7401601100
Uebing, C., Viefhaus, H., Grabke, H. J. (1990) Surface compounds and surface precipitates on single crystal surfaces. Surface and Interface Analysis, 16 (1). 483-487 doi:10.1002/sia.7401601101
Ferber, Hermann, Hoflund, Gar B., Mount, Charles K., Hoshino, Shigeo (1990) Novel chromium layers formed by nitrogen-ion implantation of conventional and ABCD electrodeposited films, part 4. Surface and Interface Analysis, 16 (1). 488-492 doi:10.1002/sia.7401601102
Heras, J. M., Viscido, L., Wedler, G., Borgmann, D. (1990) AES study of palladium overlayers on polycrystalline copper. Surface and Interface Analysis, 16 (1). 493-496 doi:10.1002/sia.7401601103
Fitzgerald, A. G., Henderson, A. E., Storey, B. E. (1990) A microbeam analytical study of a-C: H films. Surface and Interface Analysis, 16 (1). 497-503 doi:10.1002/sia.7401601104
Es-Souni, M., Beaven, P. A. (1990) Microanalysis of inclusion/matrix interfaces in weld metals. Surface and Interface Analysis, 16 (1). 504-509 doi:10.1002/sia.7401601105
Buschert, R. C., Gibson, P. N., Gissler, W., Haupt, J., Manara, A., Jiang, X., Reichelt, K. (1990) Comparative study of TiNx films deposited by reactive ion beam sputtering at 77 and 300 K. Surface and Interface Analysis, 16 (1). 510-514 doi:10.1002/sia.7401601106
Ingo, G. M., Paparazzo, E., Bagnarelli, O., Zacchetti, N. (1990) XPS studies on cerium, zirconium and yttrium valence states in plasma-sprayed coatings. Surface and Interface Analysis, 16 (1). 515-519 doi:10.1002/sia.7401601107
Mezey, L. Z., Hofer, W., Varga, P., Giber, J. (1990) The drastic effect of oxygen on surface segregation. Surface and Interface Analysis, 16 (1). 520-525 doi:10.1002/sia.7401601108
Delplancke, M. P., Jardinier-Offergeld, M., Bouillon, F. (1990) Surface characterization of rhodium-copper alloys. Surface and Interface Analysis, 16 (1). 526-529 doi:10.1002/sia.7401601109
Saillard, P., Gicquel, A., Amouroux, J., Moncoffre, N., Tousset, J. (1990) Role of oxygen contamination on titanium nitriding. Surface and Interface Analysis, 16 (1). 530-534 doi:10.1002/sia.7401601110
Prieto, P., Galán, L., Sanz, J. M., Rueda, F. (1990) An XPS study of the kinetics of dissolution of ZrO2 in α-Zr. Surface and Interface Analysis, 16 (1). 535-539 doi:10.1002/sia.7401601111
Jehn, Hermann A., Grallath, Erhard, Strydom, I. LeRoux, Hofmann, Siegfried (1990) Comparison of AES analyses of transition-metal nitride coatings with carrier-gas heat extraction analyses. Surface and Interface Analysis, 16 (1). 540-545 doi:10.1002/sia.7401601112
Lejček, P., Hofmann, S. (1990) Temperature dependence of the phosphorus segregation at the twin boundary in an Fe-4 at.% Si alloy. Surface and Interface Analysis, 16 (1). 546-551 doi:10.1002/sia.7401601113
Nettleship, D. J., Wild, R. K. (1990) Segregation to grain boundaries in nimonic PE16 superalloy. Surface and Interface Analysis, 16 (1). 552-558 doi:10.1002/sia.7401601114
Lejček, P., Koutník, M., Brádler, J., Paidar, V., Potměšilová, A. (1990) Segregation behaviour of low-Σ grain boundaries in dilute FeSi alloy. Surface and Interface Analysis, 16 (1). 559-560 doi:10.1002/sia.7401601115
Reniers, F., Jardinier-Offergeld, M., Bouillon, F. (1990) Surface structure and composition of silver-palladium alloys. Surface and Interface Analysis, 16 (1). 560-562 doi:10.1002/sia.7401601116
Tschulik, A., Mezey, L. Z., Störi, H. (1990) Electron spectroscopic investigation of segregation of non-metallic impurities in iron. Surface and Interface Analysis, 16 (1). 562-563 doi:10.1002/sia.7401601117
Minni, E., Hofmann, S., Sivonen, S. J. (1990) An AES study of particles in the welding fumes of mild and stainless steel. Surface and Interface Analysis, 16 (1). 563-564 doi:10.1002/sia.7401601118
Lausmaa, J., Ask, M., Rolander, U., Kasemo, B., Bjursten, L. M., Ericson, L. E., Thomsen, P. (1990) Surface preparation and spectroscopic analysis of titanium implant materials. Surface and Interface Analysis, 16 (1). 567-568 doi:10.1002/sia.7401601119
Di Castro, V., Polzonetti, G., Contini, G., Cozza, C., Paponetti, B. (1990) XPS study of MnO2 minerals treated by bioleaching. Surface and Interface Analysis, 16 (1). 571-574 doi:10.1002/sia.7401601120
Berghmans, P. A., Muir, I. J., Adams, F. C. (1990) Surface analysis of chrysophosphate materials. Surface and Interface Analysis, 16 (1). 575-579 doi:10.1002/sia.7401601121
Muir, I. J., Bancroft, G. M., Nesbitt, H. W. (1990) Analysis of dissolved plagioclase mineral surfaces. Surface and Interface Analysis, 16 (1). 581-582 doi:10.1002/sia.7401601122

See Also

These are possibly similar items as determined by title/reference text matching only.

(1990, July) Surface and Interface Analysis Vol. 15 (7) Wiley
(1986, July) Surface and Interface Analysis Vol. 9 (1) Wiley
(1988, July) Surface and Interface Analysis Vol. 12 (1) Wiley
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(1986, July) Surface and Interface Analysis Vol. 9 (3) Wiley
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