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Werner, H. W. (1990) Opening speech. Surface and Interface Analysis, 16 (1). doi:10.1002/sia.740160103

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Reference TypeJournal (article/letter/editorial)
TitleOpening speech
JournalSurface and Interface Analysis
AuthorsWerner, H. W.Author
Year1990 (July)Volume16
Issue1
PublisherWiley
DOIdoi:10.1002/sia.740160103Search in ResearchGate
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Mindat Ref. ID6502702Long-form Identifiermindat:1:5:6502702:8
GUID0
Full ReferenceWerner, H. W. (1990) Opening speech. Surface and Interface Analysis, 16 (1). doi:10.1002/sia.740160103
Plain TextWerner, H. W. (1990) Opening speech. Surface and Interface Analysis, 16 (1). doi:10.1002/sia.740160103
In(1990, July) Surface and Interface Analysis Vol. 16 (1) Wiley

See Also

These are possibly similar items as determined by title/reference text matching only.

Werner, H. W. (1992) Opening speech. Surface and Interface Analysis, 19 (1). doi:10.1002/sia.740190103
Werner, H. W. (1994) Opening speech. Surface and Interface Analysis, 22 (1). doi:10.1002/sia.740220103
Werner, H. W. (1986) Opening Speeches. Surface and Interface Analysis, 9 (1). doi:10.1002/sia.740090103
Werner, H. W. (1988) Opening Speeches. Surface and Interface Analysis, 12 (1). doi:10.1002/sia.740120103
van der Wijk, A., Werner, H. W. (1990) Diagnostic techniques for failure analysis and reliability evaluation in VLSI technology. Surface and Interface Analysis, 16 (1). 253-262 doi:10.1002/sia.740160155
(1990) Masthead. Surface and Interface Analysis, 16 (1). doi:10.1002/sia.740160101
Gries, W. H., Werner, W. (1990) Take-off angle and film thickness dependences of the attenuation length of X-ray photoelectrons by a trajectory reversal method. Surface and Interface Analysis, 16 (1). 149-153 doi:10.1002/sia.740160129
Briggs, D. (1990) Preface/Editorial. Surface and Interface Analysis, 16 (1). doi:10.1002/sia.740160102
Muir, I. J., Bancroft, G. M., Nesbitt, H. W. (1990) Analysis of dissolved plagioclase mineral surfaces. Surface and Interface Analysis, 16 (1). 581-582 doi:10.1002/sia.7401601122
Dinges, H. W., Kempf, B., Burkhard, H. (1990) Determination of sputter damage on InP by MAI ellipsometry. Surface and Interface Analysis, 16 (1). 77-81 doi:10.1002/sia.740160118
Kessel, R., Schultze, J. W. (1990) Surface analytical and photoelectrochemical investigations of conducting polymers. Surface and Interface Analysis, 16 (1). 401-406 doi:10.1002/sia.740160184
 
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