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Gries, W. H., Werner, W. (1990) Take-off angle and film thickness dependences of the attenuation length of X-ray photoelectrons by a trajectory reversal method. Surface and Interface Analysis, 16 (1). 149-153 doi:10.1002/sia.740160129

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Reference TypeJournal (article/letter/editorial)
TitleTake-off angle and film thickness dependences of the attenuation length of X-ray photoelectrons by a trajectory reversal method
JournalSurface and Interface Analysis
AuthorsGries, W. H.Author
Werner, W.Author
Year1990 (July)Volume16
Issue1
PublisherWiley
DOIdoi:10.1002/sia.740160129Search in ResearchGate
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Mindat Ref. ID6502801Long-form Identifiermindat:1:5:6502801:8
GUID0
Full ReferenceGries, W. H., Werner, W. (1990) Take-off angle and film thickness dependences of the attenuation length of X-ray photoelectrons by a trajectory reversal method. Surface and Interface Analysis, 16 (1). 149-153 doi:10.1002/sia.740160129
Plain TextGries, W. H., Werner, W. (1990) Take-off angle and film thickness dependences of the attenuation length of X-ray photoelectrons by a trajectory reversal method. Surface and Interface Analysis, 16 (1). 149-153 doi:10.1002/sia.740160129
In(1990, July) Surface and Interface Analysis Vol. 16 (1) Wiley

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Werner, W. S. M., Gries, W. H., Störi, H. (1991) Analytical expression describing the attenuation of Auger electrons and photoelectrons in solids. Surface and Interface Analysis, 17 (10). 693-704 doi:10.1002/sia.740171003
Gries, W. H., Koschig, W. (1990) Determination of the centroid depths of the depth profiles of ion-implanted analytes by angle-resolved electron microbeam analysis. Surface and Interface Analysis, 16 (1). 321-324 doi:10.1002/sia.740160168
Werner, H. W. (1990) Opening speech. Surface and Interface Analysis, 16 (1). doi:10.1002/sia.740160103
Gunter, P. L. J., De Jong, A. M., Niemantsverdriet, J. W., Rheiter, H. J. H. (1992) Evaluation of take-off-angle-dependent XPS for determining the thickness of passivation layers on aluminium and silicon. Surface and Interface Analysis, 19 (1). 161-164 doi:10.1002/sia.740190131
Gries, W. H. (1985) Depth profiling on a sputtered bevel of sub-degree slope angle. Surface and Interface Analysis, 7 (1). 29-34 doi:10.1002/sia.740070107
Marcus, P., Hinnen, C., Olefjord, I. (1993) Determination of attenuation lengths of photoelectrons in aluminium and aluminium oxide by angle-dependent x-ray photoelectron spectroscopy. Surface and Interface Analysis, 20 (11). 923-929 doi:10.1002/sia.740201108
Gries, W. H., Wybenga, F. T. (1981) Determination of the centroid depths of shallow impurity profiles by X-ray fluorescence spectrometry. Surface and Interface Analysis, 3 (6). 251-257 doi:10.1002/sia.740030605
Gries, W. H. (1996) A Universal Predictive Equation for the Inelastic Mean Free Pathlengths of X-ray Photoelectrons and Auger Electrons. Surface and Interface Analysis, 24 (1). 38-50 doi:10.1002/(sici)1096-9918(199601)24:1<38::aid-sia84>3.0.co;2-h
Powell, C. J., Werner, W. S. M., Smekal, W. (2011) Effects of elastic scattering and analyzer-acceptance angle on the analysis of angle-resolved X-ray photoelectron spectroscopy data. Surface and Interface Analysis, 43 (7). 1046-1056 doi:10.1002/sia.3689
van der Wijk, A., Werner, H. W. (1990) Diagnostic techniques for failure analysis and reliability evaluation in VLSI technology. Surface and Interface Analysis, 16 (1). 253-262 doi:10.1002/sia.740160155
Powell, C. J., Werner, W. S. M., Smekal, W., Tasneem, G. (2013) Effective attenuation lengths for photoelectrons in thin films of silicon oxynitride and hafnium oxynitride on silicon. Surface and Interface Analysis, 45 (2). 628-638 doi:10.1002/sia.5103
 
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