| Reference Type | Journal (article/letter/editorial) |
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| Title | Determination of attenuation lengths of photoelectrons in aluminium and aluminium oxide by angle-dependent x-ray photoelectron spectroscopy |
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| Journal | Surface and Interface Analysis |
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| Authors | Marcus, P. | Author |
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| Hinnen, C. | Author |
| Olefjord, I. | Author |
| Year | 1993 (October) | Volume | 20 |
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| Issue | 11 |
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| Publisher | Wiley |
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| DOI | doi:10.1002/sia.740201108Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 6504035 | Long-form Identifier | mindat:1:5:6504035:7 |
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| GUID | 0 |
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| Full Reference | Marcus, P., Hinnen, C., Olefjord, I. (1993) Determination of attenuation lengths of photoelectrons in aluminium and aluminium oxide by angle-dependent x-ray photoelectron spectroscopy. Surface and Interface Analysis, 20 (11). 923-929 doi:10.1002/sia.740201108 |
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| Plain Text | Marcus, P., Hinnen, C., Olefjord, I. (1993) Determination of attenuation lengths of photoelectrons in aluminium and aluminium oxide by angle-dependent x-ray photoelectron spectroscopy. Surface and Interface Analysis, 20 (11). 923-929 doi:10.1002/sia.740201108 |
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| In | (1993, October) Surface and Interface Analysis Vol. 20 (11) Wiley |
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