Xu, N. S., Pearce, C. G., Sullivan, J. L. (1990) A time-of-flight study of water molecular ion and neutral scattering from copper surfaces. Surface and Interface Analysis, 16 (1). 154-158 doi:10.1002/sia.740160130

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Reference Type	Journal (article/letter/editorial)
Title	A time-of-flight study of water molecular ion and neutral scattering from copper surfaces
Journal	Surface and Interface Analysis
Authors	Xu, N. S.		Author
	Pearce, C. G.		Author
	Sullivan, J. L.		Author
Year	1990 (July)	Volume	16
Issue	1
Publisher	Wiley
DOI	doi:10.1002/sia.740160130Search in ResearchGate
	Generate Citation Formats
Mindat Ref. ID	6502802	Long-form Identifier	mindat:1:5:6502802:7
GUID	0
Full Reference	Xu, N. S., Pearce, C. G., Sullivan, J. L. (1990) A time-of-flight study of water molecular ion and neutral scattering from copper surfaces. Surface and Interface Analysis, 16 (1). 154-158 doi:10.1002/sia.740160130
Plain Text	Xu, N. S., Pearce, C. G., Sullivan, J. L. (1990) A time-of-flight study of water molecular ion and neutral scattering from copper surfaces. Surface and Interface Analysis, 16 (1). 154-158 doi:10.1002/sia.740160130
In	(1990, July) Surface and Interface Analysis Vol. 16 (1) Wiley

	*Xu, N. S., Sullivan, J. L. (1990) Helium ion and fast atom scattering from polycrystalline copper surfaces. Surface and Interface Analysis, 16 (1). 18-24 doi:10.1002/sia.740160107*
	Giles, R., Sullivan, J. L., Pearce, C. G. (1994) The design and development of a time of flight fast atom/ion scattering spectrometer. Surface and Interface Analysis, 22 (1). 576-580 doi:10.1002/sia.7402201122
	Lynch, J., Rahbari, R., Lee, L. T., Bisiaux, M., Lecourtier, J., Chauveteau, G. (1990) XPS study of ion adsorption on siliceous surfaces. Surface and Interface Analysis, 16 (1). 471 doi:10.1002/sia.740160199
	van der Wel, H., Ponjeé, J. J., van Vroonhoven, F. C. B. M., van Velzen, P. N. T. (1990) Surface analysis of monomolecular layers with time-of-flight SIMS. Surface and Interface Analysis, 16 (1). 216-217 doi:10.1002/sia.740160145
	*Heras, J. M., Viscido, L., Wedler, G., Borgmann, D. (1990) AES study of palladium overlayers on polycrystalline copper. Surface and Interface Analysis, 16 (1). 493-496 doi:10.1002/sia.7401601103*
	*He, A., Karpuzov, D., Xu, S. (2006) Ink identification by time-of-flight secondary ion mass spectroscopy. Surface and Interface Analysis, 38 (4). 854-858 doi:10.1002/sia.2246*
	Daolio, S., Facchin, B., Pagura, C., De Battisti, A., Battaglin, G. (1990) Mixed-Oxide electrode study by secondary ion mass spectrometry. Surface and Interface Analysis, 16 (1). 457-460 doi:10.1002/sia.740160194
	Sullivan, J. L., Yu, W., Saied, S. O. (1994) ARXPS and LEISS characterizations for chemically etched and ion-bombarded GaAs(100) surfaces. Surface and Interface Analysis, 22 (1). 515-519 doi:10.1002/sia.7402201109
	Ackelid, U., Fogelberg, J., Petersson, L.-G. (1990) A reaction cell for studies of catalytic surfaces: Ammonia blocking of water production on platinum in hydrogen/oxygen atmospheres. Surface and Interface Analysis, 16 (1). 381 doi:10.1002/sia.740160180
	*Gruzza, B., Pariset, C., Abdellaoui, S. (1990) An ELS and AES study of InP(100) surfaces during Sb atom condensation. Surface and Interface Analysis, 16 (1). 54-58 doi:10.1002/sia.740160114*
	*Muir, I. J., Bancroft, G. M., Nesbitt, H. W. (1990) Analysis of dissolved plagioclase mineral surfaces. Surface and Interface Analysis, 16 (1). 581-582 doi:10.1002/sia.7401601122*

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Xu, N. S., Pearce, C. G., Sullivan, J. L. (1990) A time-of-flight study of water molecular ion and neutral scattering from copper surfaces. Surface and Interface Analysis, 16 (1). 154-158 doi:10.1002/sia.740160130

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