登录注册
Quick Links : Mindat手册The Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
主页关于 MindatMindat手册Mindat的历史版权Who We Are联系我们于 Mindat.org刊登广告
捐赠给 MindatCorporate Sponsorship赞助板页已赞助的板页在 Mindat刊登 广告的广告商于 Mindat.org刊登广告
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
搜索矿物的性质搜索矿物的化学Mineral Visual ExplorerAdvanced Locality Search随意显示任何一 种矿物Random Locality使用minID搜索邻近产地Search Articles搜索词汇表更多搜索选项
搜索:
矿物名称:
地区产地名称:
关键字:
 
Mindat手册添加新照片Rate Photos产区编辑报告Coordinate Completion Report添加词汇表项目
Mining Companies统计会员列表Mineral MuseumsClubs & Organizations矿物展及活动The Mindat目录表设备设置The Mineral QuizTime Machine
照片搜索Photo GalleriesSearch by ColorPhoto Colour Explorer今天最新的照片昨天最新的照片用户照片相集过去每日精选照片相集Photography

Paneva, A., Szekeres, A. (1993) Ellipsometric approach for evaluation of optical parameters in thin multilayer structures. Surface and Interface Analysis, 20 (4). 290-294 doi:10.1002/sia.740200405

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleEllipsometric approach for evaluation of optical parameters in thin multilayer structures
JournalSurface and Interface Analysis
AuthorsPaneva, A.Author
Szekeres, A.Author
Year1993 (April)Volume20
Issue4
PublisherWiley
DOIdoi:10.1002/sia.740200405Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID6504168Long-form Identifiermindat:1:5:6504168:4
GUID0
Full ReferencePaneva, A., Szekeres, A. (1993) Ellipsometric approach for evaluation of optical parameters in thin multilayer structures. Surface and Interface Analysis, 20 (4). 290-294 doi:10.1002/sia.740200405
Plain TextPaneva, A., Szekeres, A. (1993) Ellipsometric approach for evaluation of optical parameters in thin multilayer structures. Surface and Interface Analysis, 20 (4). 290-294 doi:10.1002/sia.740200405
In(1993, April) Surface and Interface Analysis Vol. 20 (4) Wiley

See Also

These are possibly similar items as determined by title/reference text matching only.

Paneva, A., Szekeres, A. (1992) Multiple-angle ellipsometric study of the interfacial layer in Si?SiO2 structures. Surface and Interface Analysis, 19 (1). 483-486 doi:10.1002/sia.740190191
Paneva, A., Szekeres, A. (1999) Ellipsometric approach for determination of the pseudodielectric function of the Si–interface in the Si–SiO2 structure. Surface Science, 443 (3). 186-194 doi:10.1016/s0039-6028(99)00962-0
(1993) Masthead. Surface and Interface Analysis, 20 (4). doi:10.1002/sia.740200401
(1993) Erratum. Surface and Interface Analysis, 20 (4). doi:10.1002/sia.740200415
(1993) Product news. Surface and Interface Analysis, 20 (4). 328 doi:10.1002/sia.740200412
(1993) Forthcoming events. Surface and Interface Analysis, 20 (4). 329 doi:10.1002/sia.740200413
(1993) Recently accepted papers. Surface and Interface Analysis, 20 (4). 330 doi:10.1002/sia.740200414
Jablonski, A., Powell, C. J. (1993) Formalism and parameters for quantitative surface analysis by Auger electron spectroscopy and x-ray photoelectron spectroscopy. Surface and Interface Analysis, 20 (9). 771-786 doi:10.1002/sia.740200906
Bortchagovsky, Eugene G. (2002) Ellipsometric approach to the monitoring of tip-surface proximity in NFO. Surface and Interface Analysis, 33 (2). 81-84 doi:10.1002/sia.1166
(1993) Masthead. Surface and Interface Analysis, 20 (1). doi:10.1002/sia.740200101
(1993) Masthead. Surface and Interface Analysis, 20 (10). doi:10.1002/sia.740201001
 
and/or  
版权所有© mindat.org1993年至2026年，除了规定的地方。 Mindat.org全赖于全球数千个以上成员和支持者们的参与。
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
隐私政策 - 条款和条款细则 - 联络我们 - Report a bug/vulnerability Current server date and time: 2026.6.5 11:23:33
Go to top of page