Bortchagovsky, Eugene G. (2002) Ellipsometric approach to the monitoring of tip-surface proximity in NFO. Surface and Interface Analysis, 33 (2). 81-84 doi:10.1002/sia.1166

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Reference Type	Journal (article/letter/editorial)
Title	Ellipsometric approach to the monitoring of tip-surface proximity in NFO
Journal	Surface and Interface Analysis
Authors	Bortchagovsky, Eugene G.		Author
Year	2002 (February)	Volume	33
Issue	2
Publisher	Wiley
DOI	doi:10.1002/sia.1166Search in ResearchGate
	Generate Citation Formats
Mindat Ref. ID	6507789	Long-form Identifier	mindat:1:5:6507789:2
GUID	0
Full Reference	Bortchagovsky, Eugene G. (2002) Ellipsometric approach to the monitoring of tip-surface proximity in NFO. Surface and Interface Analysis, 33 (2). 81-84 doi:10.1002/sia.1166
Plain Text	Bortchagovsky, Eugene G. (2002) Ellipsometric approach to the monitoring of tip-surface proximity in NFO. Surface and Interface Analysis, 33 (2). 81-84 doi:10.1002/sia.1166
In	(2002, February) Surface and Interface Analysis Vol. 33 (2) Wiley

	*Bortchagovsky, Eugene G. (1999) Ellipsometric method in near-field recording. Surface and Interface Analysis, 27 (5). 482-485 doi:10.1002/(sici)1096-9918(199905/06)27:5/6<482::aid-sia500>3.0.co;2-b*
	Lugstein, Alois, Bertagnolli, Emmerich, Kranz, Christine, Mizaikoff, Boris (2002) Fabrication of a ring nanoelectrode in an AFM tip: novel approach towards simultaneous electrochemical and topographical imaging. Surface and Interface Analysis, 33 (2). 146-150 doi:10.1002/sia.1178
	*Fuchs, H., Röthig, C. (2002) Preface. Surface and Interface Analysis, 33 (2). 49 doi:10.1002/sia.1159*
	*Paneva, A., Szekeres, A. (1993) Ellipsometric approach for evaluation of optical parameters in thin multilayer structures. Surface and Interface Analysis, 20 (4). 290-294 doi:10.1002/sia.740200405*
	*Lee, Soo-Young (2005) A flexible and efficient approach to E-beam proximity effect correction—PYRAMID. Surface and Interface Analysis, 37 (11). 919-926 doi:10.1002/sia.2110*
	*Watts, John F. (2002) Editorial. Surface and Interface Analysis, 33 (3). 175pp. doi:10.1002/sia.1213*
	*Seah, M. P. (2002) Resolution parameters for model functions used in surface analysis. Surface and Interface Analysis, 33 (12). 950-953 doi:10.1002/sia.1452*
	*Watts, John F (2002) Preface. Surface and Interface Analysis, 33 (10). 773-774 doi:10.1002/sia.1473*
	*Knapp, Helmut F., Mesquida, Patrick, Stemmer, Andreas (2002) Imaging the surface potential of active purple membrane. Surface and Interface Analysis, 33 (2). 108-112 doi:10.1002/sia.1172*
	Ferré-Borrull, Josep, Steinert, Jörg, Duparré, Angela (2002) Extending the capabilities of scanning probe microscopy for microroughness analysis in surface engineering. Surface and Interface Analysis, 33 (2). 92-95 doi:10.1002/sia.1169
	*Nowakowski, Robert, Luckham, Paul (2002) Imaging the surface details of red blood cells with atomic force microscopy. Surface and Interface Analysis, 33 (2). 118-121 doi:10.1002/sia.1174*

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Bortchagovsky, Eugene G. (2002) Ellipsometric approach to the monitoring of tip-surface proximity in NFO. Surface and Interface Analysis, 33 (2). 81-84 doi:10.1002/sia.1166

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