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(1993, April) Surface and Interface Analysis Vol. 20 (4) Wiley

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Reference TypeJournal (issue)
JournalSurface and Interface Analysis
Year1993 (April)Volume20
Issue<   4   >
PublisherWiley
Mindat Ref. ID6504160Long-form Identifiermindat:1:5:6504160:2
GUID0
Full Reference(1993, April) Surface and Interface Analysis Vol. 20 (4) Wiley
Plain Text(1993, April) Surface and Interface Analysis Vol. 20 (4) Wiley
In(n.d.) Surface and Interface Analysis Vol. 20. Wiley

Contains

(1993) Masthead. Surface and Interface Analysis, 20 (4). doi:10.1002/sia.740200401
(1993) Erratum. Surface and Interface Analysis, 20 (4). doi:10.1002/sia.740200415
(1993) Surface and Interface Analysis, 20 (4). Wiley. doi:10.1002/sia.v20:4
Dwyer, V. M., Richards, J. M. (1993) Exact analytical solutions and close approximations to the depth distribution function in AES and XPS. Surface and Interface Analysis, 20 (4). 271-275 doi:10.1002/sia.740200402
Hashiguchi, Y., Mizuno, K., Nagoshi, M., Kasamura, H., Shiozawa, K., Fujita, D., Yoshihara, K. (1993) Surface analytical study of the cause of mass gain of the kilogram prototype. Surface and Interface Analysis, 20 (4). 276-282 doi:10.1002/sia.740200403
Mutel, B., Dessaux, O., Goudmand, P., Gengernbre, L., Grimblot, J. (1993) Energy consumption and kinetic evolution of nitrogen fixation on polyethlene terephthalate by remote nitrogen plasma: XPS study. Surface and Interface Analysis, 20 (4). 283-289 doi:10.1002/sia.740200404
Paneva, A., Szekeres, A. (1993) Ellipsometric approach for evaluation of optical parameters in thin multilayer structures. Surface and Interface Analysis, 20 (4). 290-294 doi:10.1002/sia.740200405
Frank, Lud?k (1993) Work function contrast detection for testing the cleanliness of ion-bombarded surfaces in Auger microanalysis. Surface and Interface Analysis, 20 (4). 295-303 doi:10.1002/sia.740200406
Johansson, Leena-Sisko (1993) Static SIMS studies of coated TiO2 pigments. Surface and Interface Analysis, 20 (4). 304-308 doi:10.1002/sia.740200407
Vizkelethy, G., Revsez, P., Mayer, J. W., Li, Jian (1993) Quantification of oxygen and carbon in highTc superconducting films by (?,?) elastic resonance technique. Surface and Interface Analysis, 20 (4). 309-316 doi:10.1002/sia.740200408
Jablonski, A. (1993) Universal energy dependence of the inelastic mean free path. Surface and Interface Analysis, 20 (4). 317-321 doi:10.1002/sia.740200409
Powell, C. J., Shimizu, R. (1993) Formation of Technical Committee 201 on Surface Chemical Analysis by the International Organization for Standardization. Surface and Interface Analysis, 20 (4). 322-325 doi:10.1002/sia.740200410
Short, R. D. (1993) Secondary ion mass spectrometry, SIMS VIII. A. Benninghoven, K. T. F. Janssen, J. Tumpner and H. W. Werner (Eds.). No of pages: 944. ISBN 0471 930644. Price: £115.00. Wiley, Chichester (1992). Surface and Interface Analysis, 20 (4). 326-327 doi:10.1002/sia.740200411
(1993) Product news. Surface and Interface Analysis, 20 (4). 328 doi:10.1002/sia.740200412
(1993) Forthcoming events. Surface and Interface Analysis, 20 (4). 329 doi:10.1002/sia.740200413
(1993) Recently accepted papers. Surface and Interface Analysis, 20 (4). 330 doi:10.1002/sia.740200414

See Also

These are possibly similar items as determined by title/reference text matching only.

(1993, January) Surface and Interface Analysis Vol. 20 (1) Wiley
(1993, September) Surface and Interface Analysis Vol. 20 (10) Wiley
(1993, October) Surface and Interface Analysis Vol. 20 (11) Wiley
(1993, November) Surface and Interface Analysis Vol. 20 (12) Wiley
(1993, December) Surface and Interface Analysis Vol. 20 (13) Wiley
(1993, February) Surface and Interface Analysis Vol. 20 (2) Wiley
(1993, March) Surface and Interface Analysis Vol. 20 (3) Wiley
(1993, May) Surface and Interface Analysis Vol. 20 (5) Wiley
(1993, May) Surface and Interface Analysis Vol. 20 (6) Wiley
(1993, June) Surface and Interface Analysis Vol. 20 (7) Wiley
(1993, July) Surface and Interface Analysis Vol. 20 (8) Wiley
 
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