(1993, November) Surface and Interface Analysis Vol. 20 (12) Wiley

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Reference Type	Journal (issue)
Journal	Surface and Interface Analysis
Year	1993 (November)	Volume	20
Issue	< 12 >
Publisher	Wiley
Mindat Ref. ID	6504044	Long-form Identifier	mindat:1:5:6504044:5
GUID	0
Full Reference	(1993, November) Surface and Interface Analysis Vol. 20 (12) Wiley
Plain Text	(1993, November) Surface and Interface Analysis Vol. 20 (12) Wiley
In	(n.d.) Surface and Interface Analysis Vol. 20. Wiley

Contains

	*(1993) Masthead. Surface and Interface Analysis, 20 (12). doi:10.1002/sia.740201201*
	*(1993) Surface and Interface Analysis, 20 (12). Wiley. doi:10.1002/sia.v20:12*
	Jenkins, S. N., Castle, J. E. (1993) Preliminary results from the development of a transmission x-ray photoelectron spectrometer. Surface and Interface Analysis, 20 (12). 935-940 doi:10.1002/sia.740201202
	Leinen, D., Fernández, A., Espinós, J. P., González-Elipe, A. R. (1993) XPS and ISS study of NiTiO3and PbTiO3subjected to low-energy ion bombardment. I. Influence of the type of ion (Ar+and O 2+). Surface and Interface Analysis, 20 (12). 941-948 doi:10.1002/sia.740201203
	Kamnev, Alexander A., Angelov, Venelin, Smekhnov, Alexander A. (1993) Application of transmission Mössbauer spectroscopy to the surface study of Ni(II)-Fe(III) hydroxide electrocatalysts: Comparison with AES data. Surface and Interface Analysis, 20 (12). 949-954 doi:10.1002/sia.740201204
	Krastev, V., Marinova, Ts., Karpuzov, D., Kalitzova, M., Vitali, G., Rossi, M. (1993) XPS study of laser-annealed ion-implanted GaAs. Surface and Interface Analysis, 20 (12). 955-958 doi:10.1002/sia.740201205
	*Payling, Richard, Jones, D. G., Gower, S. A. (1993) Quantitative analysis with d.c.- and r.f.-glow discharge spectrometry. Surface and Interface Analysis, 20 (12). 959-966 doi:10.1002/sia.740201206*
	Kurbatov, G., Viefhaus, H., Grabke, H. J. (1993) Segregation of phosphorus at the metal/scale interface during oxidation of Ni and Ni-20Cr. Surface and Interface Analysis, 20 (12). 967-976 doi:10.1002/sia.740201207
	*Miller, James D., Harris, William C., Zajac, Gerry W. (1993) Composite interface analysis using voltage contrast XPS. Surface and Interface Analysis, 20 (12). 977-983 doi:10.1002/sia.740201208*
	Barkshire, I. R., Prutton, M., Greenwood, J. C., El Gomati, M. M. (1993) Automatic removal of substrate backscattering effects in Auger imaging and spectroscopy. Surface and Interface Analysis, 20 (12). 984-990 doi:10.1002/sia.740201209
	Linton, R. W., Mawn, M. P., Belu, A. M., DeSimone, J. M., Hunt, M. O., Menceloglu, Y. Z., Cramer, H. G., Benninghoven, A. (1993) Time-of-flight secondary ion mass spectrometric analysis of polymer surfaces and additives. Surface and Interface Analysis, 20 (12). 991-999 doi:10.1002/sia.740201210
	*van der Heide, P. A. W., McIntyre, N. S. (1993) SIMS imaging of insulator surfaces. Surface and Interface Analysis, 20 (12). 1000-1006 doi:10.1002/sia.740201211*
	Coon, S. R., Calaway, W. F., Pellin, M. J., Burnett, J. W., White, J. M. (1993) Molecular photofragmentation during non-resonant multiphoton ionization of sputtered species. Surface and Interface Analysis, 20 (12). 1007-1010 doi:10.1002/sia.740201212
	*(1993) Forthcoming events. Surface and Interface Analysis, 20 (12). 1011 doi:10.1002/sia.740201213*
	*(1993) Recently accepted papers. Surface and Interface Analysis, 20 (12). 1012 doi:10.1002/sia.740201214*

	*(1991, November) Surface and Interface Analysis* Vol. 17 (12) Wiley**
	*(1995, November) Surface and Interface Analysis* Vol. 23 (12) Wiley**
	*(1996, November) Surface and Interface Analysis* Vol. 24 (12) Wiley**
	*(1997, November) Surface and Interface Analysis* Vol. 25 (12) Wiley**
	*(1998, November) Surface and Interface Analysis* Vol. 26 (12) Wiley**
	*(1993, January) Surface and Interface Analysis* Vol. 20 (1) Wiley**
	*(1993, September) Surface and Interface Analysis* Vol. 20 (10) Wiley**
	*(1993, October) Surface and Interface Analysis* Vol. 20 (11) Wiley**
	*(1993, December) Surface and Interface Analysis* Vol. 20 (13) Wiley**
	*(1993, February) Surface and Interface Analysis* Vol. 20 (2) Wiley**
	*(1993, March) Surface and Interface Analysis* Vol. 20 (3) Wiley**

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(1993, November) Surface and Interface Analysis Vol. 20 (12) Wiley

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