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Leinen, D., Fernández, A., Espinós, J. P., González-Elipe, A. R. (1993) XPS and ISS study of NiTiO3and PbTiO3subjected to low-energy ion bombardment. I. Influence of the type of ion (Ar+and O 2+). Surface and Interface Analysis, 20 (12). 941-948 doi:10.1002/sia.740201203

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Reference TypeJournal (article/letter/editorial)
TitleXPS and ISS study of NiTiO3and PbTiO3subjected to low-energy ion bombardment. I. Influence of the type of ion (Ar+and O 2+)
JournalSurface and Interface Analysis
AuthorsLeinen, D.Author
Fernández, A.Author
Espinós, J. P.Author
González-Elipe, A. R.Author
Year1993 (November)Volume20
Issue12
PublisherWiley
DOIdoi:10.1002/sia.740201203Search in ResearchGate
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Mindat Ref. ID6504049Long-form Identifiermindat:1:5:6504049:0
GUID0
Full ReferenceLeinen, D., Fernández, A., Espinós, J. P., González-Elipe, A. R. (1993) XPS and ISS study of NiTiO3and PbTiO3subjected to low-energy ion bombardment. I. Influence of the type of ion (Ar+and O 2+). Surface and Interface Analysis, 20 (12). 941-948 doi:10.1002/sia.740201203
Plain TextLeinen, D., Fernández, A., Espinós, J. P., González-Elipe, A. R. (1993) XPS and ISS study of NiTiO3and PbTiO3subjected to low-energy ion bombardment. I. Influence of the type of ion (Ar+and O 2+). Surface and Interface Analysis, 20 (12). 941-948 doi:10.1002/sia.740201203
In(1993, November) Surface and Interface Analysis Vol. 20 (12) Wiley

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Caballero, A., Leinen, D., Espinós, J. P., Fernández, A., González-Elipe, A. R. (1994) Use of XAS and chemical probes to study the structural damage induced in oxide ceramics by bombardment with low-energy ions. Surface and Interface Analysis, 21 (6). 418-424 doi:10.1002/sia.740210617
Fernández, A., Espinós, J. P., Leinen, D., González-Elipe, A. R., Sanz, J. M. (1994) Charging and mixing effects during the XPS analysis of mixtures of oxides. Surface and Interface Analysis, 22 (1). 111-114 doi:10.1002/sia.740220127
Munuera, G., González-Elipe, A. R., Espinós, J. P., Navío, A., Fernández, A. (1986) XPS study of irradiated polycrystalline TiO2. Surface and Interface Analysis, 9 (4). 248 doi:10.1002/sia.740090412
Leinen, D., Fernández, A., Espinós, J.P., Holgado, J.P., González-Elipe, A.R. (1993) An XPS study of the mixing effects induced by ion bombardment in composite oxides. Applied Surface Science, 68. 453-459 doi:10.1016/0169-4332(93)90226-2
González-Elipe, A. R., Sanz, J. M., Espinós, J. P., Fernandez, A., Munuera, G. (1992) Chemical changes in titanate surfaces induced by Ar+ion bombardment. Surface and Interface Analysis, 19 (1). 286-290 doi:10.1002/sia.740190154
Espinós, J. P., González-Elipe, A. R., Fernández, A., Munuera, G. (1992) Use of XPS and Ar+depth profiling to determine the dispersion degree of Ni in Ni/TiO2and Ni/SiO2catalysts. Surface and Interface Analysis, 19 (1). 508-512 doi:10.1002/sia.740190194
Muñoz, A., Munuera, G., Malet, P., González-Elipe, A. R., Espinós, J. P. (1988) XPS and TRP/TPO Study of the behaviour of rhodium particles supported on TiO2. Surface and Interface Analysis, 12 (4). 247-252 doi:10.1002/sia.740120404
Caballero, A., Espinós, J.P., Fernández, A., Leinen, D., González-Elipe, A.R. (1995) Surface modification of oxide materials subjected to low energy ion bombardment: a XAS study. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 97 (1). 397-401 doi:10.1016/0168-583x(95)00276-6
Mansilla, C., Gracia, F., Martin-Concepción, A. I., Espinós, J. P., Holgado, J. P., Yubero, F., González-Elipe, A. R. (2007) Study of the first nucleation steps of thin films by XPS inelastic peak shape analysis. Surface and Interface Analysis, 39 (4). 331-336 doi:10.1002/sia.2509
Caballero, A., Leinen, D., Fernández, A., Justo, A., Espinós, J. P., González‐Elipe, A. R. (1995) Contribution of the x‐ray absorption spectroscopy to study TiO2thin films prepared by ion beam induced chemical vapor deposition. Journal of Applied Physics, 77 (2). 591-597 doi:10.1063/1.359043
Jiménez, V. M., Lassaletta, G., Fernández, A., Espinós, J. P., González-Elipe, A. R. (1997) Substrate Effects and Chemical State Plots for the XPS Analysis of Supported TiO2 Catalysts. Surface and Interface Analysis, 25 (4). 292-294 doi:10.1002/(sici)1096-9918(199704)25:4<292::aid-sia214>3.0.co;2-d
 
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