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Fernández, A., Espinós, J. P., Leinen, D., González-Elipe, A. R., Sanz, J. M. (1994) Charging and mixing effects during the XPS analysis of mixtures of oxides. Surface and Interface Analysis, 22 (1). 111-114 doi:10.1002/sia.740220127

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Reference TypeJournal (article/letter/editorial)
TitleCharging and mixing effects during the XPS analysis of mixtures of oxides
JournalSurface and Interface Analysis
AuthorsFernández, A.Author
Espinós, J. P.Author
Leinen, D.Author
González-Elipe, A. R.Author
Sanz, J. M.Author
Year1994 (July)Volume22
Issue1
PublisherWiley
DOIdoi:10.1002/sia.740220127Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID6504830Long-form Identifiermindat:1:5:6504830:4
GUID0
Full ReferenceFernández, A., Espinós, J. P., Leinen, D., González-Elipe, A. R., Sanz, J. M. (1994) Charging and mixing effects during the XPS analysis of mixtures of oxides. Surface and Interface Analysis, 22 (1). 111-114 doi:10.1002/sia.740220127
Plain TextFernández, A., Espinós, J. P., Leinen, D., González-Elipe, A. R., Sanz, J. M. (1994) Charging and mixing effects during the XPS analysis of mixtures of oxides. Surface and Interface Analysis, 22 (1). 111-114 doi:10.1002/sia.740220127
In(1994, July) Surface and Interface Analysis Vol. 22 (1) Wiley

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Munuera, G., González-Elipe, A. R., Espinós, J. P., Navío, A., Fernández, A. (1986) XPS study of irradiated polycrystalline TiO2. Surface and Interface Analysis, 9 (4). 248 doi:10.1002/sia.740090412
Leinen, D., Fernández, A., Espinós, J. P., González-Elipe, A. R. (1993) XPS and ISS study of NiTiO3and PbTiO3subjected to low-energy ion bombardment. I. Influence of the type of ion (Ar+and O 2+). Surface and Interface Analysis, 20 (12). 941-948 doi:10.1002/sia.740201203
Caballero, A., Leinen, D., Espinós, J. P., Fernández, A., González-Elipe, A. R. (1994) Use of XAS and chemical probes to study the structural damage induced in oxide ceramics by bombardment with low-energy ions. Surface and Interface Analysis, 21 (6). 418-424 doi:10.1002/sia.740210617
Espinós, J. P., González-Elipe, A. R., Fernández, A., Munuera, G. (1992) Use of XPS and Ar+depth profiling to determine the dispersion degree of Ni in Ni/TiO2and Ni/SiO2catalysts. Surface and Interface Analysis, 19 (1). 508-512 doi:10.1002/sia.740190194
González-Elipe, A. R., Sanz, J. M., Espinós, J. P., Fernandez, A., Munuera, G. (1992) Chemical changes in titanate surfaces induced by Ar+ion bombardment. Surface and Interface Analysis, 19 (1). 286-290 doi:10.1002/sia.740190154
Jiménez, V. M., Lassaletta, G., Fernández, A., Espinós, J. P., González-Elipe, A. R. (1997) Substrate Effects and Chemical State Plots for the XPS Analysis of Supported TiO2 Catalysts. Surface and Interface Analysis, 25 (4). 292-294 doi:10.1002/(sici)1096-9918(199704)25:4<292::aid-sia214>3.0.co;2-d
Leinen, D., Fernández, A., Espinós, J.P., Holgado, J.P., González-Elipe, A.R. (1993) An XPS study of the mixing effects induced by ion bombardment in composite oxides. Applied Surface Science, 68. 453-459 doi:10.1016/0169-4332(93)90226-2
Muñoz, A., Munuera, G., Malet, P., González-Elipe, A. R., Espinós, J. P. (1988) XPS and TRP/TPO Study of the behaviour of rhodium particles supported on TiO2. Surface and Interface Analysis, 12 (4). 247-252 doi:10.1002/sia.740120404
Mansilla, C., Gracia, F., Martin-Concepción, A. I., Espinós, J. P., Holgado, J. P., Yubero, F., González-Elipe, A. R. (2007) Study of the first nucleation steps of thin films by XPS inelastic peak shape analysis. Surface and Interface Analysis, 39 (4). 331-336 doi:10.1002/sia.2509
Yubero, F., Holgado, J. P., Barranco, A., González-Elipe, A. R. (2002) Determination of surface nanostructure from analysis of electron plasmon losses in XPS. Surface and Interface Analysis, 34 (1). 201-205 doi:10.1002/sia.1283
Barranco, A., Yubero, F., Espinós, J. P., González-Elipe, A. R. (2001) The chemical state vector: a new concept for the characterization of oxide interfaces. Surface and Interface Analysis, 31 (8). 761-767 doi:10.1002/sia.1107
 
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