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Dwyer, V. M., Richards, J. M. (1993) Exact analytical solutions and close approximations to the depth distribution function in AES and XPS. Surface and Interface Analysis, 20 (4). 271-275 doi:10.1002/sia.740200402

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Reference TypeJournal (article/letter/editorial)
TitleExact analytical solutions and close approximations to the depth distribution function in AES and XPS
JournalSurface and Interface Analysis
AuthorsDwyer, V. M.Author
Richards, J. M.Author
Year1993 (April)Volume20
Issue4
PublisherWiley
DOIdoi:10.1002/sia.740200402Search in ResearchGate
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Mindat Ref. ID6504162Long-form Identifiermindat:1:5:6504162:0
GUID0
Full ReferenceDwyer, V. M., Richards, J. M. (1993) Exact analytical solutions and close approximations to the depth distribution function in AES and XPS. Surface and Interface Analysis, 20 (4). 271-275 doi:10.1002/sia.740200402
Plain TextDwyer, V. M., Richards, J. M. (1993) Exact analytical solutions and close approximations to the depth distribution function in AES and XPS. Surface and Interface Analysis, 20 (4). 271-275 doi:10.1002/sia.740200402
In(1993, April) Surface and Interface Analysis Vol. 20 (4) Wiley

See Also

These are possibly similar items as determined by title/reference text matching only.

Dwyer, V. M., Richards, J. M. (1992) The depth distribution function in Auger/XPS analysis. Surface and Interface Analysis, 18 (7). 555-560 doi:10.1002/sia.740180717
Dwyer, V. M. (1993) Reconstruction of the depth profile from angle-resolved AES/XPS. Surface and Interface Analysis, 20 (8). 687-695 doi:10.1002/sia.740200813
Cumpson, Peter J. (1993) Elastic scattering corrections in AES and XPS: I. Two rapid Monte Carlo methods for calculating the depth distribution function. Surface and Interface Analysis, 20 (8). 727-741 doi:10.1002/sia.740200818
Dwyer, V. M. (1993) Angular distribution of electrons elastically backscattered from surfaces. Surface and Interface Analysis, 20 (6). 513-518 doi:10.1002/sia.740200605
Pavlyák, F., Bertóti, I., Mohai, M., Biczó, I., Giber, J. (1993) AES and XPS characterization of SiNxlayers. Surface and Interface Analysis, 20 (3). 221-227 doi:10.1002/sia.740200306
Grant, J. T. (1989) Methods for quantitative analysis in XPS and AES. Surface and Interface Analysis, 14 (6). 271-283 doi:10.1002/sia.740140602
Dwyer, V. M. (1994) Incorporation of elastic scattering into composition-depth profile reconstruction from angle-resolved Auger/XPS data. Surface and Interface Analysis, 21 (9). 637-642 doi:10.1002/sia.740210907
Hunt, C. P., Anthony, M. T., Seah, M. P. (1984) AES and XPS depth profiling certified reference material. Surface and Interface Analysis, 6 (2). 92-93 doi:10.1002/sia.740060211
Seah, M. P. (1986) Data compilations: their use to improve measurement certainty in surface analysis by aes and xps. Surface and Interface Analysis, 9 (2). 85-98 doi:10.1002/sia.740090203
Pan, F.-M., Lin, Y.-L., Oung, J.-C. (1992) XPS and AES studies of carbon steel polarized in aqueous molybdate solutions. Surface and Interface Analysis, 19 (1). 409-413 doi:10.1002/sia.740190176
Hofmann, S., Zalar, A., Cirlin, E.-H., Vajo, J. J., Mathieu, H. J., Panjan, P. (1993) Interlaboratory comparison of the depth resolution in sputter depth profiling of Ni/Cr multilayers with and without sample rotation using AES, XPS, and SIMS. Surface and Interface Analysis, 20 (8). 621-626 doi:10.1002/sia.740200803
 
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