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Hunt, C. P., Anthony, M. T., Seah, M. P. (1984) AES and XPS depth profiling certified reference material. Surface and Interface Analysis, 6 (2). 92-93 doi:10.1002/sia.740060211

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Reference TypeJournal (article/letter/editorial)
TitleAES and XPS depth profiling certified reference material
JournalSurface and Interface Analysis
AuthorsHunt, C. P.Author
Anthony, M. T.Author
Seah, M. P.Author
Year1984 (April)Volume6
Issue2
PublisherWiley
DOIdoi:10.1002/sia.740060211Search in ResearchGate
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Mindat Ref. ID6500536Long-form Identifiermindat:1:5:6500536:3
GUID0
Full ReferenceHunt, C. P., Anthony, M. T., Seah, M. P. (1984) AES and XPS depth profiling certified reference material. Surface and Interface Analysis, 6 (2). 92-93 doi:10.1002/sia.740060211
Plain TextHunt, C. P., Anthony, M. T., Seah, M. P. (1984) AES and XPS depth profiling certified reference material. Surface and Interface Analysis, 6 (2). 92-93 doi:10.1002/sia.740060211
In(1984, April) Surface and Interface Analysis Vol. 6 (2) Wiley

See Also

These are possibly similar items as determined by title/reference text matching only.

Hunt, C. P., Seah, M. P. (1983) Characterization of a high depth-resolution tantalum pentoxide sputter profiling reference material. Surface and Interface Analysis, 5 (5). 199-209 doi:10.1002/sia.740050506
Anthony, M. T., Seah, M. P. (1984) XPS: Energy calibration of electron spectrometers. 2—Results of an interlaboratory comparison. Surface and Interface Analysis, 6 (3). 107-115 doi:10.1002/sia.740060303
Seah, M. P., Hunt, C. P. (1983) The depth dependence of the depth resolution in composition-depth profiling with Auger Electron Spectroscopy. Surface and Interface Analysis, 5 (1). 33-37 doi:10.1002/sia.740050108
Seah, M. P., Anthony, M. T. (1984) Quantitative XPS: The calibration of spectrometer intensity—energy response functions. 1—The establishment of reference procedures and instrument behaviour. Surface and Interface Analysis, 6 (5). 230-241 doi:10.1002/sia.740060506
Smith, G. C., Seah, M. P. (1990) Standard reference spectra for XPS and AES: Their derivation, validation and use. Surface and Interface Analysis, 16 (1). 144-148 doi:10.1002/sia.740160128
Anthony, M. T., Seah, M. P. (1984) XPS: Energy calibration of electron spectrometers. 1—An absolute, traceable energy calibration and the provision of atomic reference line energies. Surface and Interface Analysis, 6 (3). 95-106 doi:10.1002/sia.740060302
Seah, M. P., Spencer, S. J., Gilmore, I. S., Johnstone, J. E. (2000) Depth resolution in sputter depth profiling-characterization of a third batch of tantalum pentoxide on tantalum certified reference material by AES and SIMS. Surface and Interface Analysis, 29 (1). 73-81 doi:10.1002/(sici)1096-9918(200001)29:1<73::aid-sia695>3.0.co;2-3
Seah, M. P. (1986) Data compilations: their use to improve measurement certainty in surface analysis by aes and xps. Surface and Interface Analysis, 9 (2). 85-98 doi:10.1002/sia.740090203
Seah, M. P., Jones, M. E., Anthony, M. T. (1984) Quantitative XPS: The calibration of spectrometer intensity—energy response functions. 2—Results of interlaboratory measurements for commercial instruments. Surface and Interface Analysis, 6 (5). 242-254 doi:10.1002/sia.740060507
Seah, M. P., Smith, G. C., Anthony, M. T. (1990) AES: Energy calibration of electron spectrometers. I?an absolute, traceable energy calibration and the provision of atomic reference line energies. Surface and Interface Analysis, 15 (5). 293-308 doi:10.1002/sia.740150503
Seah, M. P. (1980) The quantitative analysis of surfaces by XPS: A review. Surface and Interface Analysis, 2 (6). 222-239 doi:10.1002/sia.740020607
 
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