| Reference Type | Journal (article/letter/editorial) |
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| Title | Quantitative XPS: The calibration of spectrometer intensity—energy response functions. 2—Results of interlaboratory measurements for commercial instruments |
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| Journal | Surface and Interface Analysis |
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| Authors | Seah, M. P. | Author |
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| Jones, M. E. | Author |
| Anthony, M. T. | Author |
| Year | 1984 (October) | Volume | 6 |
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| Issue | 5 |
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| Publisher | Wiley |
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| DOI | doi:10.1002/sia.740060507Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 6500587 | Long-form Identifier | mindat:1:5:6500587:7 |
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|
| GUID | 0 |
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| Full Reference | Seah, M. P., Jones, M. E., Anthony, M. T. (1984) Quantitative XPS: The calibration of spectrometer intensity—energy response functions. 2—Results of interlaboratory measurements for commercial instruments. Surface and Interface Analysis, 6 (5). 242-254 doi:10.1002/sia.740060507 |
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| Plain Text | Seah, M. P., Jones, M. E., Anthony, M. T. (1984) Quantitative XPS: The calibration of spectrometer intensity—energy response functions. 2—Results of interlaboratory measurements for commercial instruments. Surface and Interface Analysis, 6 (5). 242-254 doi:10.1002/sia.740060507 |
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| In | (1984, October) Surface and Interface Analysis Vol. 6 (5) Wiley |
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These are possibly similar items as determined by title/reference text matching only.