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Anthony, M. T., Seah, M. P. (1984) XPS: Energy calibration of electron spectrometers. 2—Results of an interlaboratory comparison. Surface and Interface Analysis, 6 (3). 107-115 doi:10.1002/sia.740060303

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Reference TypeJournal (article/letter/editorial)
TitleXPS: Energy calibration of electron spectrometers. 2—Results of an interlaboratory comparison
JournalSurface and Interface Analysis
AuthorsAnthony, M. T.Author
Seah, M. P.Author
Year1984 (June)Volume6
Issue3
PublisherWiley
DOIdoi:10.1002/sia.740060303Search in ResearchGate
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Mindat Ref. ID6500543Long-form Identifiermindat:1:5:6500543:3
GUID0
Full ReferenceAnthony, M. T., Seah, M. P. (1984) XPS: Energy calibration of electron spectrometers. 2—Results of an interlaboratory comparison. Surface and Interface Analysis, 6 (3). 107-115 doi:10.1002/sia.740060303
Plain TextAnthony, M. T., Seah, M. P. (1984) XPS: Energy calibration of electron spectrometers. 2—Results of an interlaboratory comparison. Surface and Interface Analysis, 6 (3). 107-115 doi:10.1002/sia.740060303
In(1984, June) Surface and Interface Analysis Vol. 6 (3) Wiley

See Also

These are possibly similar items as determined by title/reference text matching only.

Anthony, M. T., Seah, M. P. (1984) XPS: Energy calibration of electron spectrometers. 1—An absolute, traceable energy calibration and the provision of atomic reference line energies. Surface and Interface Analysis, 6 (3). 95-106 doi:10.1002/sia.740060302
Seah, M. P., Jones, M. E., Anthony, M. T. (1984) Quantitative XPS: The calibration of spectrometer intensity—energy response functions. 2—Results of interlaboratory measurements for commercial instruments. Surface and Interface Analysis, 6 (5). 242-254 doi:10.1002/sia.740060507
Seah, M. P., Smith, G. C. (1991) AES: Accurate intensity calibration of electron spectrometers—results of a BCR interlaboratory comparison co-sponsored by the VAMAS SCA TWP. Surface and Interface Analysis, 17 (12). 855-874 doi:10.1002/sia.740171206
Seah, M. P., Anthony, M. T. (1984) Quantitative XPS: The calibration of spectrometer intensity—energy response functions. 1—The establishment of reference procedures and instrument behaviour. Surface and Interface Analysis, 6 (5). 230-241 doi:10.1002/sia.740060506
Seah, M. P., Smith, G. C., Anthony, M. T. (1990) AES: Energy calibration of electron spectrometers. I?an absolute, traceable energy calibration and the provision of atomic reference line energies. Surface and Interface Analysis, 15 (5). 293-308 doi:10.1002/sia.740150503
Hunt, C. P., Anthony, M. T., Seah, M. P. (1984) AES and XPS depth profiling certified reference material. Surface and Interface Analysis, 6 (2). 92-93 doi:10.1002/sia.740060211
Powell, C. J. (1995) Energy calibration of x-ray photoelectron spectrometers: Results of an interlaboratory comparison to evaluate a proposed calibration procedure. Surface and Interface Analysis, 23 (3). 121-132 doi:10.1002/sia.740230302
Seah, M. P. (1993) XPS reference procedure for the accurate intensity calibration of electron spectrometers? results of a BCR intercomparison co-sponsored by the VAMAS SCA TWA. Surface and Interface Analysis, 20 (3). 243-266 doi:10.1002/sia.740200309
Seah, M. P., Smith, G. C. (1990) AES: Energy calibration of electron spectrometers. II?results of a BCRinterlaboratory comparison co-sponsored by the vamas SCS TWP. Surface and Interface Analysis, 15 (5). 309-322 doi:10.1002/sia.740150504
Seah, M. P. (2003) Summary of ISO/TC 201 Standard XII. ISO 17973:2002?Surface chemical analysis?Medium-resolution Auger electron spectrometers?Calibration of energy scales for elemental analysis. Surface and Interface Analysis, 35 (3). 329-330 doi:10.1002/sia.1530
Seah, M. P. (1980) The quantitative analysis of surfaces by XPS: A review. Surface and Interface Analysis, 2 (6). 222-239 doi:10.1002/sia.740020607
 
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