登录注册
Quick Links : Mindat手册The Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
主页关于 MindatMindat手册Mindat的历史版权Who We Are联系我们于 Mindat.org刊登广告
捐赠给 MindatCorporate Sponsorship赞助板页已赞助的板页在 Mindat刊登 广告的广告商于 Mindat.org刊登广告
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
搜索矿物的性质搜索矿物的化学Mineral Visual ExplorerAdvanced Locality Search随意显示任何一 种矿物Random Locality使用minID搜索邻近产地Search Articles搜索词汇表更多搜索选项
搜索:
矿物名称:
地区产地名称:
关键字:
 
Mindat手册添加新照片Rate Photos产区编辑报告Coordinate Completion Report添加词汇表项目
Mining Companies统计会员列表Mineral MuseumsClubs & Organizations矿物展及活动The Mindat目录表设备设置The Mineral QuizTime Machine
照片搜索Photo GalleriesSearch by ColorPhoto Colour Explorer今天最新的照片昨天最新的照片用户照片相集过去每日精选照片相集Photography

Kyutt, R. N. (2012) Structural characterization of AlGaN/GaN superlattices by three-beam X-ray diffraction. Technical Physics Letters, 38. 38-41 doi:10.1134/s1063785012010075

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleStructural characterization of AlGaN/GaN superlattices by three-beam X-ray diffraction
JournalTechnical Physics Letters
AuthorsKyutt, R. N.Author
Year2012 (January)Volume38
PublisherPleiades Publishing Ltd
DOIdoi:10.1134/s1063785012010075Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID6207788Long-form Identifiermindat:1:5:6207788:2
GUID0
Full ReferenceKyutt, R. N. (2012) Structural characterization of AlGaN/GaN superlattices by three-beam X-ray diffraction. Technical Physics Letters, 38. 38-41 doi:10.1134/s1063785012010075
Plain TextKyutt, R. N. (2012) Structural characterization of AlGaN/GaN superlattices by three-beam X-ray diffraction. Technical Physics Letters, 38. 38-41 doi:10.1134/s1063785012010075
In(n.d.) Technical Physics Letters Vol. 38. Pleiades Publishing Ltd

See Also

These are possibly similar items as determined by title/reference text matching only.

Kyutt, R. N. (2010) Studying defect structure of GaN epilayers by means of three-beam X-ray diffraction analysis. Technical Physics Letters, 36. 690-693 doi:10.1134/s1063785010080031
Kyutt, R. N., Ivanov, S. V. (2014) The structural state of epitaxial ZnO layers assessed by measuring the integral intensity of three- and two-beam X-ray diffraction. Technical Physics Letters, 40. 894-896 doi:10.1134/s106378501410023x
Kyutt, R. N., Ratnikov, V. V., Mosina, G. N., Shcheglov, M. P. (1999) Structural perfection of GaN epitaxial layers according to x-ray diffraction measurements. Physics of the Solid State, 41. 25-31 doi:10.1134/1.1130722
Kyutt, R. N., Dyshekov, A. A. (2011) Effect of epilayer microstructure on shape of X-Ray diffraction peaks. Technical Physics Letters, 37. 306-308 doi:10.1134/s1063785011040110
Kyutt, R. N., Shcheglov, M. P., Davydov, V. Yu., Usikov, A. S. (2004) Deformation of AlGaN/GaN superlattice layers according to x-ray diffraction data. Physics of the Solid State, 46. 364-370 doi:10.1134/1.1649438
Kyutt, R. N., Dinaev, Yu. A. (2009) Interlayer relaxation in group-III-nitride-based heterostructures according to X-Ray diffraction data. Technical Physics Letters, 35. 976-980 doi:10.1134/s1063785009110029
Kyutt, R. N., Mosina, G. N., Shcheglov, M. P., Sorokin, L. M. (2006) The defect structure of AlGaN/GaN superlattices grown on sapphire by the MOCVD method. Physics of the Solid State, 48. 1577-1583 doi:10.1134/s1063783406080257
Kyutt, R. N. (2011) Three-wave diffraction in damaged epitaxial layers with a wurtzite structure. Technical Physics, 56 (5). 668-675 doi:10.1134/s1063784211050203
Kyutt, R. N., Shcheglov, M. P. (2018) Reciprocal-Space Maps of X-Ray Diffraction Intensity Distribution and Their Relation to the Dislocation Structure of Epitaxial Layers. Technical Physics Letters, 44. 548-550 doi:10.1134/s106378501806024x
Sorokin, L. M., Kyutt, R. N., Ratnikov, V. V., Kalmykov, A. E. (2021) Structural Characterization of a Short-Period Superlattice Based on the CdF2/CaF2/Si(111) Heterostructure by Transmission Electron Microscopy and X-Ray Diffractometry. Technical Physics Letters, 47 (12) 893-896 doi:10.1134/s1063785021080125
Kyutt, R. N., Ivanov, S. V. (2014) X-ray diffraction determination of the degree of ordering of a solid solution in epitaxial AlGaN layers. Physics of the Solid State, 56. 2390-2392 doi:10.1134/s106378341412021x
 
and/or  
版权所有© mindat.org1993年至2026年，除了规定的地方。 Mindat.org全赖于全球数千个以上成员和支持者们的参与。
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
隐私政策 - 条款和条款细则 - 联络我们 - Report a bug/vulnerability Current server date and time: 2026.6.6 13:16:20
Go to top of page