Kyutt, R. N., Dyshekov, A. A. (2011) Effect of epilayer microstructure on shape of X-Ray diffraction peaks. Technical Physics Letters, 37. 306-308 doi:10.1134/s1063785011040110
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Effect of epilayer microstructure on shape of X-Ray diffraction peaks | ||
| Journal | Technical Physics Letters | ||
| Authors | Kyutt, R. N. | Author | |
| Dyshekov, A. A. | Author | ||
| Year | 2011 (April) | Volume | 37 |
| Publisher | Pleiades Publishing Ltd | ||
| DOI | doi:10.1134/s1063785011040110Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 6207627 | Long-form Identifier | mindat:1:5:6207627:2 |
| GUID | 0 | ||
| Full Reference | Kyutt, R. N., Dyshekov, A. A. (2011) Effect of epilayer microstructure on shape of X-Ray diffraction peaks. Technical Physics Letters, 37. 306-308 doi:10.1134/s1063785011040110 | ||
| Plain Text | Kyutt, R. N., Dyshekov, A. A. (2011) Effect of epilayer microstructure on shape of X-Ray diffraction peaks. Technical Physics Letters, 37. 306-308 doi:10.1134/s1063785011040110 | ||
| In | (n.d.) Technical Physics Letters Vol. 37. Pleiades Publishing Ltd | ||
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