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Kyutt, R. N., Ivanov, S. V. (2014) The structural state of epitaxial ZnO layers assessed by measuring the integral intensity of three- and two-beam X-ray diffraction. Technical Physics Letters, 40. 894-896 doi:10.1134/s106378501410023x

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Reference TypeJournal (article/letter/editorial)
TitleThe structural state of epitaxial ZnO layers assessed by measuring the integral intensity of three- and two-beam X-ray diffraction
JournalTechnical Physics Letters
AuthorsKyutt, R. N.Author
Ivanov, S. V.Author
Year2014 (October)Volume40
PublisherPleiades Publishing Ltd
DOIdoi:10.1134/s106378501410023xSearch in ResearchGate
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Mindat Ref. ID6208437Long-form Identifiermindat:1:5:6208437:8
GUID0
Full ReferenceKyutt, R. N., Ivanov, S. V. (2014) The structural state of epitaxial ZnO layers assessed by measuring the integral intensity of three- and two-beam X-ray diffraction. Technical Physics Letters, 40. 894-896 doi:10.1134/s106378501410023x
Plain TextKyutt, R. N., Ivanov, S. V. (2014) The structural state of epitaxial ZnO layers assessed by measuring the integral intensity of three- and two-beam X-ray diffraction. Technical Physics Letters, 40. 894-896 doi:10.1134/s106378501410023x
In(n.d.) Technical Physics Letters Vol. 40. Pleiades Publishing Ltd

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Kyutt, R. N., Ivanov, S. V. (2014) X-ray diffraction determination of the degree of ordering of a solid solution in epitaxial AlGaN layers. Physics of the Solid State, 56. 2390-2392 doi:10.1134/s106378341412021x
Kyutt, R. N. (2012) Structural characterization of AlGaN/GaN superlattices by three-beam X-ray diffraction. Technical Physics Letters, 38. 38-41 doi:10.1134/s1063785012010075
Kyutt, R. N., Shcheglov, M. P. (2018) Reciprocal-Space Maps of X-Ray Diffraction Intensity Distribution and Their Relation to the Dislocation Structure of Epitaxial Layers. Technical Physics Letters, 44. 548-550 doi:10.1134/s106378501806024x
Kyutt, R. N. (2018) Intensity Distribution of the Three-Wave Diffraction from Dislocation Epitaxial Layers in the Reciprocal Space. Physics of the Solid State, 60. 695-699 doi:10.1134/s1063783418040182
Kyutt, R. N., Ratnikov, V. V., Mosina, G. N., Shcheglov, M. P. (1999) Structural perfection of GaN epitaxial layers according to x-ray diffraction measurements. Physics of the Solid State, 41. 25-31 doi:10.1134/1.1130722
Kyutt, R. N. (2010) Studying defect structure of GaN epilayers by means of three-beam X-ray diffraction analysis. Technical Physics Letters, 36. 690-693 doi:10.1134/s1063785010080031
Kyutt, R. N. (2011) Three-wave diffraction in damaged epitaxial layers with a wurtzite structure. Technical Physics, 56 (5). 668-675 doi:10.1134/s1063784211050203
Kyutt, R. T. (2017) Defect structure of epitaxial layers of III nitrides as determined by analyzing the shape of X-ray diffraction peaks. Technical Physics, 62 (4). 598-603 doi:10.1134/s1063784217040144
Kyutt, R. N. (1997) Measurement of the differential and integral distribution of diffuse x-ray scattering intensity from defects in thin strained layers. Physics of the Solid State, 39. 1052-1056 doi:10.1134/1.1130155
Kyutt, R. N. (2016) On the role of secondary extinction in the measurement of the integrated intensity of X-ray diffraction peaks and in the determination of the thickness of damaged epitaxial layers. Physics of the Solid State, 58. 1090-1097 doi:10.1134/s1063783416060287
Sorokin, L. M., Kyutt, R. N., Ratnikov, V. V., Kalmykov, A. E. (2021) Structural Characterization of a Short-Period Superlattice Based on the CdF2/CaF2/Si(111) Heterostructure by Transmission Electron Microscopy and X-Ray Diffractometry. Technical Physics Letters, 47 (12) 893-896 doi:10.1134/s1063785021080125
 
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