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Miyazawa, Tetsuya, Nakayama, Koji, Tanaka, Atsushi, Asano, Katsunori, Ji, Shi-yang, Kojima, Kazutoshi, Ishida, Yuuki, Tsuchida, Hidekazu (2015) Epitaxial growth and characterization of thick multi-layer 4H-SiC for very high-voltage insulated gate bipolar transistors. Journal of Applied Physics, 118 (8). 85702pp. doi:10.1063/1.4929456

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Reference TypeJournal (article/letter/editorial)
TitleEpitaxial growth and characterization of thick multi-layer 4H-SiC for very high-voltage insulated gate bipolar transistors
JournalJournal of Applied Physics
AuthorsMiyazawa, TetsuyaAuthor
Nakayama, KojiAuthor
Tanaka, AtsushiAuthor
Asano, KatsunoriAuthor
Ji, Shi-yangAuthor
Kojima, KazutoshiAuthor
Ishida, YuukiAuthor
Tsuchida, HidekazuAuthor
Year2015 (August 28)Volume118
Issue8
PublisherAIP Publishing
DOIdoi:10.1063/1.4929456Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5203763Long-form Identifiermindat:1:5:5203763:6
GUID0
Full ReferenceMiyazawa, Tetsuya, Nakayama, Koji, Tanaka, Atsushi, Asano, Katsunori, Ji, Shi-yang, Kojima, Kazutoshi, Ishida, Yuuki, Tsuchida, Hidekazu (2015) Epitaxial growth and characterization of thick multi-layer 4H-SiC for very high-voltage insulated gate bipolar transistors. Journal of Applied Physics, 118 (8). 85702pp. doi:10.1063/1.4929456
Plain TextMiyazawa, Tetsuya, Nakayama, Koji, Tanaka, Atsushi, Asano, Katsunori, Ji, Shi-yang, Kojima, Kazutoshi, Ishida, Yuuki, Tsuchida, Hidekazu (2015) Epitaxial growth and characterization of thick multi-layer 4H-SiC for very high-voltage insulated gate bipolar transistors. Journal of Applied Physics, 118 (8). 85702pp. doi:10.1063/1.4929456
In(2015, August) Journal of Applied Physics Vol. 118 (8) AIP Publishing


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