Yoon, Jun-Sik, Rim, Taiuk, Kim, Jungsik, Kim, Kihyun, Baek, Chang-Ki, Jeong, Yoon-Ha (2015) Statistical variability study of random dopant fluctuation on gate-all-around inversion-mode silicon nanowire field-effect transistors. Applied Physics Letters, 106 (10). 103507pp. doi:10.1063/1.4914976
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Statistical variability study of random dopant fluctuation on gate-all-around inversion-mode silicon nanowire field-effect transistors | ||
| Journal | Applied Physics Letters | ||
| Authors | Yoon, Jun-Sik | Author | |
| Rim, Taiuk | Author | ||
| Kim, Jungsik | Author | ||
| Kim, Kihyun | Author | ||
| Baek, Chang-Ki | Author | ||
| Jeong, Yoon-Ha | Author | ||
| Year | 2015 (March 9) | Volume | 106 |
| Issue | 10 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.4914976Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8632110 | Long-form Identifier | mindat:1:5:8632110:5 |
| GUID | 0 | ||
| Full Reference | Yoon, Jun-Sik, Rim, Taiuk, Kim, Jungsik, Kim, Kihyun, Baek, Chang-Ki, Jeong, Yoon-Ha (2015) Statistical variability study of random dopant fluctuation on gate-all-around inversion-mode silicon nanowire field-effect transistors. Applied Physics Letters, 106 (10). 103507pp. doi:10.1063/1.4914976 | ||
| Plain Text | Yoon, Jun-Sik, Rim, Taiuk, Kim, Jungsik, Kim, Kihyun, Baek, Chang-Ki, Jeong, Yoon-Ha (2015) Statistical variability study of random dopant fluctuation on gate-all-around inversion-mode silicon nanowire field-effect transistors. Applied Physics Letters, 106 (10). 103507pp. doi:10.1063/1.4914976 | ||
| In | (2015, March) Applied Physics Letters Vol. 106 (10) AIP Publishing | ||
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