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Rim, Taiuk, Kim, Kihyun, Hong, Nanki, Ko, Wooree, Baek, Chang-Ki, Jeon, Sangmin, Deen, M. Jamal, Meyyappan, M., Jeong, Yoon-Ha, Lee, Jeong-Soo (2013) Investigation of the electrical stability of Si-nanowire biologically sensitive field-effect transistors with embedded Ag/AgCl pseudo reference electrode. RSC Advances, 3 (21). 7963pp. doi:10.1039/c3ra40768c

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Reference TypeJournal (article/letter/editorial)
TitleInvestigation of the electrical stability of Si-nanowire biologically sensitive field-effect transistors with embedded Ag/AgCl pseudo reference electrode
JournalRSC Advances
AuthorsRim, TaiukAuthor
Kim, KihyunAuthor
Hong, NankiAuthor
Ko, WooreeAuthor
Baek, Chang-KiAuthor
Jeon, SangminAuthor
Deen, M. JamalAuthor
Meyyappan, M.Author
Jeong, Yoon-HaAuthor
Lee, Jeong-SooAuthor
Year2013Volume3
Issue21
PublisherRoyal Society of Chemistry (RSC)
DOIdoi:10.1039/c3ra40768cSearch in ResearchGate
Generate Citation Formats
Mindat Ref. ID8086291Long-form Identifiermindat:1:5:8086291:0
GUID0
Full ReferenceRim, Taiuk, Kim, Kihyun, Hong, Nanki, Ko, Wooree, Baek, Chang-Ki, Jeon, Sangmin, Deen, M. Jamal, Meyyappan, M., Jeong, Yoon-Ha, Lee, Jeong-Soo (2013) Investigation of the electrical stability of Si-nanowire biologically sensitive field-effect transistors with embedded Ag/AgCl pseudo reference electrode. RSC Advances, 3 (21). 7963pp. doi:10.1039/c3ra40768c
Plain TextRim, Taiuk, Kim, Kihyun, Hong, Nanki, Ko, Wooree, Baek, Chang-Ki, Jeon, Sangmin, Deen, M. Jamal, Meyyappan, M., Jeong, Yoon-Ha, Lee, Jeong-Soo (2013) Investigation of the electrical stability of Si-nanowire biologically sensitive field-effect transistors with embedded Ag/AgCl pseudo reference electrode. RSC Advances, 3 (21). 7963pp. doi:10.1039/c3ra40768c
In(2013) RSC Advances Vol. 3 (21) Royal Society of Chemistry (RSC)


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