登录注册
Quick Links : Mindat手册The Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
主页关于 MindatMindat手册Mindat的历史版权Who We Are联系我们于 Mindat.org刊登广告
捐赠给 MindatCorporate Sponsorship赞助板页已赞助的板页在 Mindat刊登 广告的广告商于 Mindat.org刊登广告
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
搜索矿物的性质搜索矿物的化学Mineral Visual ExplorerAdvanced Locality Search随意显示任何一 种矿物Random Locality使用minID搜索邻近产地Search Articles搜索词汇表更多搜索选项
搜索:
矿物名称:
地区产地名称:
关键字:
 
Mindat手册添加新照片Rate Photos产区编辑报告Coordinate Completion Report添加词汇表项目
Mining Companies统计会员列表Mineral MuseumsClubs & Organizations矿物展及活动The Mindat目录表设备设置The Mineral QuizTime Machine
照片搜索Photo GalleriesSearch by ColorPhoto Colour Explorer今天最新的照片昨天最新的照片用户照片相集过去每日精选照片相集Photography

Zhang, Zhen, Yoon, Juil, Suo, Zhigang (2006) Method to analyze dislocation injection from sharp features in strained silicon structures. Applied Physics Letters, 89 (26). 261912pp. doi:10.1063/1.2424665

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleMethod to analyze dislocation injection from sharp features in strained silicon structures
JournalApplied Physics Letters
AuthorsZhang, ZhenAuthor
Yoon, JuilAuthor
Suo, ZhigangAuthor
Year2006 (December 25)Volume89
Issue26
PublisherAIP Publishing
DOIdoi:10.1063/1.2424665Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8551641Long-form Identifiermindat:1:5:8551641:4
GUID0
Full ReferenceZhang, Zhen, Yoon, Juil, Suo, Zhigang (2006) Method to analyze dislocation injection from sharp features in strained silicon structures. Applied Physics Letters, 89 (26). 261912pp. doi:10.1063/1.2424665
Plain TextZhang, Zhen, Yoon, Juil, Suo, Zhigang (2006) Method to analyze dislocation injection from sharp features in strained silicon structures. Applied Physics Letters, 89 (26). 261912pp. doi:10.1063/1.2424665
In(2006, December) Applied Physics Letters Vol. 89 (26) AIP Publishing

See Also

These are possibly similar items as determined by title/reference text matching only.

Feron, Martijn, Zhang, Zhen, Suo, Zhigang, Feron, Martijn (2007) Split singularities and dislocation injection in strained silicon. Journal of Applied Physics, 102 (2). 23502pp. doi:10.1063/1.2753674
Yoon, Juil, Zhang, Zhen, Lu, Nanshu, Suo, Zhigang (2007) The effect of coating in increasing the critical size of islands on a compliant substrate. Applied Physics Letters, 90 (21). 211912pp. doi:10.1063/1.2742911
Cordero, Nicolas, Yoon, Juil, Suo, Zhigang (2007) Channel cracks in a hermetic coating consisting of organic and inorganic layers. Applied Physics Letters, 90 (11). 111910pp. doi:10.1063/1.2713134
Zhao, Xuanhe, Suo, Zhigang (2007) Method to analyze electromechanical stability of dielectric elastomers. Applied Physics Letters, 91 (6). 61921pp. doi:10.1063/1.2768641
Zhao, Xuanhe, Suo, Zhigang (2008) Method to analyze programmable deformation of dielectric elastomer layers. Applied Physics Letters, 93 (25). 251902pp. doi:10.1063/1.3054159
Sun, Jeong-Yun, Lu, Nanshu, Yoon, Juil, Oh, Kyu-Hwan, Suo, Zhigang, Vlassak, Joost J. (2012) Debonding and fracture of ceramic islands on polymer substrates. Journal of Applied Physics, 111 (1). 13517pp. doi:10.1063/1.3673805
Kamat, S. V., Hirth, J. P. (1990) Dislocation injection in strained multilayer structures. Journal of Applied Physics, 67 (11). 6844-6850 doi:10.1063/1.345074
Zhang, Zhen, Suo, Zhigang, He, Jun (2005) Saturated voids in interconnect lines due to thermal strains and electromigration. Journal of Applied Physics, 98 (7). 74501pp. doi:10.1063/1.2061896
Izumi, Satoshi, Yip, Sidney (2008) Dislocation nucleation from a sharp corner in silicon. Journal of Applied Physics, 104 (3). 33513pp. doi:10.1063/1.2963487
Lerman, Gilad M., Israel, Abraham, Lewis, Aaron (2006) Applying solid immersion near-field optics to Raman analysis of strained silicon thin films. Applied Physics Letters, 89 (22). 223122pp. doi:10.1063/1.2398888
Kim, Jeehwan, Xie, Ya-Hong (2006) Fabrication of dislocation-free tensile strained Si thin films using controllably oxidized porous Si substrates. Applied Physics Letters, 89 (15). 152117pp. doi:10.1063/1.2360930
 
and/or  
版权所有© mindat.org1993年至2026年，除了规定的地方。 Mindat.org全赖于全球数千个以上成员和支持者们的参与。
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
隐私政策 - 条款和条款细则 - 联络我们 - Report a bug/vulnerability Current server date and time: 2026.6.7 08:58:47
Go to top of page