登录注册
Quick Links : Mindat手册The Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
主页关于 MindatMindat手册Mindat的历史版权Who We Are联系我们于 Mindat.org刊登广告
捐赠给 MindatCorporate Sponsorship赞助板页已赞助的板页在 Mindat刊登 广告的广告商于 Mindat.org刊登广告
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
搜索矿物的性质搜索矿物的化学Mineral Visual ExplorerAdvanced Locality Search随意显示任何一 种矿物Random Locality使用minID搜索邻近产地Search Articles搜索词汇表更多搜索选项
搜索:
矿物名称:
地区产地名称:
关键字:
 
Mindat手册添加新照片Rate Photos产区编辑报告Coordinate Completion Report添加词汇表项目
Mining Companies统计会员列表Mineral MuseumsClubs & Organizations矿物展及活动The Mindat目录表设备设置The Mineral QuizTime Machine
照片搜索Photo GalleriesSearch by ColorPhoto Colour Explorer今天最新的照片昨天最新的照片用户照片相集过去每日精选照片相集Photography

Bell, L. D., Smith, R. P., McDermott, B. T., Gertner, E. R., Pittman, R., Pierson, R. L., Sullivan, G. J. (1998) Ballistic-electron-emission microscopy and spectroscopy of metal/GaN interfaces. Applied Physics Letters, 72 (13). 1590-1592 doi:10.1063/1.121124

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleBallistic-electron-emission microscopy and spectroscopy of metal/GaN interfaces
JournalApplied Physics Letters
AuthorsBell, L. D.Author
Smith, R. P.Author
McDermott, B. T.Author
Gertner, E. R.Author
Pittman, R.Author
Pierson, R. L.Author
Sullivan, G. J.Author
Year1998 (March 30)Volume72
Issue13
PublisherAIP Publishing
DOIdoi:10.1063/1.121124Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8520752Long-form Identifiermindat:1:5:8520752:5
GUID0
Full ReferenceBell, L. D., Smith, R. P., McDermott, B. T., Gertner, E. R., Pittman, R., Pierson, R. L., Sullivan, G. J. (1998) Ballistic-electron-emission microscopy and spectroscopy of metal/GaN interfaces. Applied Physics Letters, 72 (13). 1590-1592 doi:10.1063/1.121124
Plain TextBell, L. D., Smith, R. P., McDermott, B. T., Gertner, E. R., Pittman, R., Pierson, R. L., Sullivan, G. J. (1998) Ballistic-electron-emission microscopy and spectroscopy of metal/GaN interfaces. Applied Physics Letters, 72 (13). 1590-1592 doi:10.1063/1.121124
In(1998, March) Applied Physics Letters Vol. 72 (13) AIP Publishing

See Also

These are possibly similar items as determined by title/reference text matching only.

Bell, L. D., Smith, R. P., McDermott, B. T., Gertner, E. R., Pittman, R., Pierson, R. L., Sullivan, G. J. (2000) Modification of GaN Schottky barrier interfaces probed by ballistic-electron-emission microscopy and spectroscopy. Applied Physics Letters, 76 (13). 1725-1727 doi:10.1063/1.126148
Heer, R., Rakoczy, D., Ploner, G., Strasser, G., Gornik, E., Smoliner, J. (1999) Metal–insulator–metal injector for ballistic electron emission spectroscopy. Applied Physics Letters, 75 (25). 4007-4009 doi:10.1063/1.125520
Heer, R., Smoliner, J., Strasser, G., Gornik, E. (1998) Ballistic electron emission microscopy on biased GaAs–AlGaAs superlattices. Applied Physics Letters, 73 (21). 3138-3140 doi:10.1063/1.122698
Kaczer, B., Im, H.-J., Pelz, J. P., Wallace, R. M. (1998) Microscopic characterization of hot-electron spreading and trapping in SiO2 films using ballistic electron emission microscopy. Applied Physics Letters, 73 (13). 1871-1873 doi:10.1063/1.122310
Heer, R., Smoliner, J., Strasser, G., Gornik, E. (1998) A highly transmittive semiconductor base for ballistic electron emission microscopy. Applied Physics Letters, 73 (9). 1218-1220 doi:10.1063/1.122132
Smith, D. L., Lee, E. Y., Narayanamurti, V. (1998) Ballistic Electron Emission Microscopy for Nonepitaxial Metal/Semiconductor Interfaces. Physical Review Letters, 80 (11). 2433-2436 doi:10.1103/physrevlett.80.2433
Alexander, F. B., Bird, V. R., Carpenter, D. R., Manley, G. W., McDermott, P. S., Peloke, J. R., Quinn, H. F., Riley, R. J., Yetter, L. R. (1964) SPONTANEOUS AND STIMULATED INFRA‐RED EMISSION FROM INDIUM PHOSPHIDE ARSENIDE DIODES. Applied Physics Letters, 4 (1). 13-15 doi:10.1063/1.1723572
Heller, E. R., Pelz, J. P. (2003) Observation of a scanning tunneling microscopy induced photocurrent during ballistic electron emission microscopy. Applied Physics Letters, 82 (22). 3919-3921 doi:10.1063/1.1579844
Heller, E. R., Tivarus, C., Pelz, J. P. (2003) Avalanche ballistic electron emission microscopy with single hot-electron sensitivity. Applied Physics Letters, 83 (14). 2841-2843 doi:10.1063/1.1613996
McDermott, B. T., Gertner, E. R., Pittman, S., Seabury, C. W., Chang, M. F. (1996) Growth and doping of GaAsSb via metalorganic chemical vapor deposition for InP heterojunction bipolar transistors. Applied Physics Letters, 68 (10). 1386-1388 doi:10.1063/1.116088
Prietsch, M., Ludeke, R. (1991) Ballistic-electron-emission microscopy and spectroscopy of GaP(110)-metal interfaces. Physical Review Letters, 66 (19). 2511-2514 doi:10.1103/physrevlett.66.2511
 
and/or  
版权所有© mindat.org1993年至2026年，除了规定的地方。 Mindat.org全赖于全球数千个以上成员和支持者们的参与。
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
隐私政策 - 条款和条款细则 - 联络我们 - Report a bug/vulnerability Current server date and time: 2026.6.7 18:53:42
Go to top of page