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Heller, E. R., Pelz, J. P. (2003) Observation of a scanning tunneling microscopy induced photocurrent during ballistic electron emission microscopy. Applied Physics Letters, 82 (22). 3919-3921 doi:10.1063/1.1579844

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Reference TypeJournal (article/letter/editorial)
TitleObservation of a scanning tunneling microscopy induced photocurrent during ballistic electron emission microscopy
JournalApplied Physics Letters
AuthorsHeller, E. R.Author
Pelz, J. P.Author
Year2003 (June 2)Volume82
Issue22
PublisherAIP Publishing
DOIdoi:10.1063/1.1579844Search in ResearchGate
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Mindat Ref. ID8535409Long-form Identifiermindat:1:5:8535409:0
GUID0
Full ReferenceHeller, E. R., Pelz, J. P. (2003) Observation of a scanning tunneling microscopy induced photocurrent during ballistic electron emission microscopy. Applied Physics Letters, 82 (22). 3919-3921 doi:10.1063/1.1579844
Plain TextHeller, E. R., Pelz, J. P. (2003) Observation of a scanning tunneling microscopy induced photocurrent during ballistic electron emission microscopy. Applied Physics Letters, 82 (22). 3919-3921 doi:10.1063/1.1579844
In(2003, June) Applied Physics Letters Vol. 82 (22) AIP Publishing

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Heller, E. R., Tivarus, C., Pelz, J. P. (2003) Avalanche ballistic electron emission microscopy with single hot-electron sensitivity. Applied Physics Letters, 83 (14). 2841-2843 doi:10.1063/1.1613996
Che, Y. L., Pelz, J. P. (2010) Ambipolar ballistic electron emission microscopy studies of gate-field modified Schottky barriers. Applied Physics Letters, 96 (24). 242106pp. doi:10.1063/1.3453866
Kaczer, B., Im, H.-J., Pelz, J. P., Wallace, R. M. (1998) Microscopic characterization of hot-electron spreading and trapping in SiO2 films using ballistic electron emission microscopy. Applied Physics Letters, 73 (13). 1871-1873 doi:10.1063/1.122310
Im, H.-J., Kaczer, B., Pelz, J. P., Choyke, W. J. (1998) Ballistic electron emission microscopy study of Schottky contacts on 6H- and 4H-SiC. Applied Physics Letters, 72 (7). 839-841 doi:10.1063/1.120910
Tivarus, C., Pelz, J. P., Hudait, M. K., Ringel, S. A. (2005) Spatial resolution of ballistic electron emission microscopy measured on metal/quantum-well Schottky contacts. Applied Physics Letters, 87 (18). 182105pp. doi:10.1063/1.2120899
Dey, Shirshendu, Shinde, S. D., Adhi, K. P., Dharmadhikari, C. V. (2009) Observation of electron tunneling induced photon emission in gallium (Ga) doped (1%) zinc oxide (ZnO) sample using scanning tunneling microscopy. Applied Physics Letters, 95 (6). 63503pp. doi:10.1063/1.3200241
Jones, D. E., Pelz, J. P., Hong, Y., Tsong, I. S. T., Xie, Y.‐H., Silverman, P. J. (1996) Strain field imaging on Si/SiGe(001)‐(2×1) surfaces by low‐energy electron microscopy and scanning tunneling microscopy. Applied Physics Letters, 69 (21). 3245-3247 doi:10.1063/1.118024
Kaczer, B., Im, H.-J., Pelz, J. P., Wallace, R. M. (1999) Erratum: “Microscopic characterization of hot-electron spreading and trapping in SiO2 films using ballistic electron emission microscopy” [Appl. Phys. Lett. 73, 1871 (1998)]. Applied Physics Letters, 74 (3). 478 doi:10.1063/1.123041
Singh, J. P., Lu, T.-M., Wang, G.-C. (2003) Field-induced cation migration in Cu oxide films by in situ scanning tunneling microscopy. Applied Physics Letters, 82 (26). 4672-4674 doi:10.1063/1.1586461
Park, K.-B., Pelz, J. P., Grim, J., Skowronski, M. (2005) Quantum well behavior of single stacking fault 3C inclusions in 4H-SiC p-i-n diodes studied by ballistic electron emission microscopy. Applied Physics Letters, 87 (23). 232103pp. doi:10.1063/1.2138442
Cai, W., Stone, S. E., Pelz, J. P., Edge, L. F., Schlom, D. G. (2007) Conduction band energies and hot-electron transport characteristics of epitaxial Sc2O3∕Si (111) studied by ballistic electron emission microscopy and internal photoemission. Applied Physics Letters, 91 (4). 42901pp. doi:10.1063/1.2757150
 
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