Mahoney, Christine M. (2010) Cluster SIMS depth profiling of stereo-specific PMMA thin films on Si. Surface and Interface Analysis, 42 (8). 1393-1401 doi:10.1002/sia.3115
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Cluster SIMS depth profiling of stereo-specific PMMA thin films on Si | ||
| Journal | Surface and Interface Analysis | ||
| Authors | Mahoney, Christine M. | Author | |
| Year | 2010 (February 19) | Volume | 42 |
| Issue | 8 | ||
| Publisher | Wiley | ||
| DOI | doi:10.1002/sia.3115Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 6512607 | Long-form Identifier | mindat:1:5:6512607:3 |
| GUID | 0 | ||
| Full Reference | Mahoney, Christine M. (2010) Cluster SIMS depth profiling of stereo-specific PMMA thin films on Si. Surface and Interface Analysis, 42 (8). 1393-1401 doi:10.1002/sia.3115 | ||
| Plain Text | Mahoney, Christine M. (2010) Cluster SIMS depth profiling of stereo-specific PMMA thin films on Si. Surface and Interface Analysis, 42 (8). 1393-1401 doi:10.1002/sia.3115 | ||
| In | (2010, February) Surface and Interface Analysis Vol. 42 (8) Wiley | ||
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