Kaciulis, S., Pandolfi, L., White, R. (2004) Depth profiling of thin films of binary metal oxides. Surface and Interface Analysis, 36 (8). 845-848 doi:10.1002/sia.1779

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Reference Type	Journal (article/letter/editorial)
Title	Depth profiling of thin films of binary metal oxides
Journal	Surface and Interface Analysis
Authors	Kaciulis, S.		Author
	Pandolfi, L.		Author
	White, R.		Author
Year	2004 (August)	Volume	36
Issue	8
Publisher	Wiley
DOI	doi:10.1002/sia.1779Search in ResearchGate
	Generate Citation Formats
Mindat Ref. ID	6509181	Long-form Identifier	mindat:1:5:6509181:0
GUID	0
Full Reference	Kaciulis, S., Pandolfi, L., White, R. (2004) Depth profiling of thin films of binary metal oxides. Surface and Interface Analysis, 36 (8). 845-848 doi:10.1002/sia.1779
Plain Text	Kaciulis, S., Pandolfi, L., White, R. (2004) Depth profiling of thin films of binary metal oxides. Surface and Interface Analysis, 36 (8). 845-848 doi:10.1002/sia.1779
In	(2004, August) Surface and Interface Analysis Vol. 36 (8) Wiley

	Pandolfi, L., Kaciulis, S., Padeletti, G., Cusmà, A., Viticoli, M. (2004) Deposition and characterization of ZrTiO4 thin films. Surface and Interface Analysis, 36 (8). 1159-1162 doi:10.1002/sia.1865
	Kaciulis, S., Cusmà, A., Padeletti, G., Pandolfi, L., Viticoli, M., Zaldo, C. (2004) Comparison of ZrxTi1−xO4 films produced by PLD and MOCVD techniques. Surface and Interface Analysis, 36 (8). 1151-1154 doi:10.1002/sia.1863
	Kaciulis, S., Pandolfi, L., Viticoli, S., Sberveglieri, G., Zampiceni, E., Wlodarski, W., Galatsis, K., Li, Y. X. (2002) Investigation of thin films of mixed oxides for gas-sensing applications. Surface and Interface Analysis, 34 (1). 672-676 doi:10.1002/sia.1385
	*Karpuzov, D., He, A., Xu, S. (2006) Metal clustering during depth profiling of thin films. Surface and Interface Analysis, 38 (4). 287-291 doi:10.1002/sia.2292*
	Gusmano, G., Bianco, A., Viticoli, M., Kaciulis, S., Mattogno, G., Pandolfi, L. (2002) Study of Zr1?xSnxTiO4 thin films prepared by a polymeric precursor route. Surface and Interface Analysis, 34 (1). 690-693 doi:10.1002/sia.1389
	Gusmano, G., Montanari, R., Kaciulis, S., Mezzi, A., Montesperelli, G., Rupprecht, L. (2004) Surface defects on collection coins of precious metals. Surface and Interface Analysis, 36 (8). 921-924 doi:10.1002/sia.1800
	*Kuypers, S., Buytaert, G., Terryn, H. (2004) Depth profiling of rolled aluminium alloys by means of GDOES. Surface and Interface Analysis, 36 (8). 833-836 doi:10.1002/sia.1776*
	*Mahoney, Christine M. (2010) Cluster SIMS depth profiling of stereo-specific PMMA thin films on Si. Surface and Interface Analysis, 42 (8). 1393-1401 doi:10.1002/sia.3115*
	*Sanz, J. M., Hofmann, S. (1986) Quantitative AES depth profiling of very thin overlayers. Surface and Interface Analysis, 8 (4). 147-157 doi:10.1002/sia.740080403*
	*Kaciulis, S. (2012) Spectroscopy of carbon: from diamond to nitride films. Surface and Interface Analysis, 44 (8). 1155-1161 doi:10.1002/sia.4892*
	*Zalar, A., Hofmann, S. (1988) Redeposition in AES sputter depth profiling of multilayer Cr/Ni thin films. Surface and Interface Analysis, 12 (2). 83-86 doi:10.1002/sia.740120204*

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Kaciulis, S., Pandolfi, L., White, R. (2004) Depth profiling of thin films of binary metal oxides. Surface and Interface Analysis, 36 (8). 845-848 doi:10.1002/sia.1779

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