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Mouhib, T., Delcorte, A., Poleunis, C., Henry, M., Bertrand, P. (2010) C60 SIMS depth profiling of bovine serum albumin protein-coating films: a conformational study. Surface and Interface Analysis, 42 (6). 641-644 doi:10.1002/sia.3349

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Reference TypeJournal (article/letter/editorial)
TitleC60 SIMS depth profiling of bovine serum albumin protein-coating films: a conformational study
JournalSurface and Interface Analysis
AuthorsMouhib, T.Author
Delcorte, A.Author
Poleunis, C.Author
Henry, M.Author
Bertrand, P.Author
Year2010 (April 23)Volume42
Issue6
PublisherWiley
DOIdoi:10.1002/sia.3349Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID6512463Long-form Identifiermindat:1:5:6512463:1
GUID0
Full ReferenceMouhib, T., Delcorte, A., Poleunis, C., Henry, M., Bertrand, P. (2010) C60 SIMS depth profiling of bovine serum albumin protein-coating films: a conformational study. Surface and Interface Analysis, 42 (6). 641-644 doi:10.1002/sia.3349
Plain TextMouhib, T., Delcorte, A., Poleunis, C., Henry, M., Bertrand, P. (2010) C60 SIMS depth profiling of bovine serum albumin protein-coating films: a conformational study. Surface and Interface Analysis, 42 (6). 641-644 doi:10.1002/sia.3349
In(2010, April) Surface and Interface Analysis Vol. 42 (6) Wiley

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Mouhib, T., Poleunis, C., Möllers, R., Niehuis, E., Defrance, P., Bertrand, P., Delcorte, A. (2013) Organic depth profiling of C60and C60/phthalocyanine layers using argon clusters. Surface and Interface Analysis, 45 (1). 163-166 doi:10.1002/sia.5052
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Fleischmann, C., Conard, T., Havelund, R., Franquet, A., Poleunis, C., Voroshazi, E., Delcorte, A., Vandervorst, W. (2014) Fundamental aspects of Arn+SIMS profiling of common organic semiconductors. Surface and Interface Analysis, 46. 54-57 doi:10.1002/sia.5621
Vermeulen, M., Poleunis, C., Delcorte, A., Bertrand, P., Sanyova, J. (2014) The use of argon cluster bombardment for the surface preparation of paint cross-sections for analysis by ToF-SIMS. Surface and Interface Analysis, 46 (10). 781-785 doi:10.1002/sia.5510
Mouhib, T., Poleunis, C., Wehbe, N., Michels, J. J., Galagan, Y., Houssiau, L., Bertrand, P., Delcorte, A. (2013) Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beams. The Analyst, 138 (22). 6801pp. doi:10.1039/c3an01035j
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