Mouhib, T., Poleunis, C., Wehbe, N., Michels, J. J., Galagan, Y., Houssiau, L., Bertrand, P., Delcorte, A. (2013) Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beams. The Analyst, 138 (22). 6801pp. doi:10.1039/c3an01035j

See Also

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	Wehbe, N., Tabarrant, T., Brison, J., Mouhib, T., Delcorte, A., Bertrand, P., Moellers, R., Niehuis, E., Houssiau, L. (2013) TOF-SIMS depth profiling of multilayer amino-acid films using large Argon cluster Arn+, C60+and Cs+sputtering ions: A comparative study. Surface and Interface Analysis, 45 (1). 178-180 doi:10.1002/sia.5121
	Mouhib, T., Delcorte, A., Poleunis, C., Bertrand, P. (2011) C60 molecular depth profiling of bilayered polymer films using ToF-SIMS. Surface and Interface Analysis, 43 (1). 175-178 doi:10.1002/sia.3539
	Mouhib, T., Poleunis, C., Möllers, R., Niehuis, E., Defrance, P., Bertrand, P., Delcorte, A. (2013) Organic depth profiling of C60and C60/phthalocyanine layers using argon clusters. Surface and Interface Analysis, 45 (1). 163-166 doi:10.1002/sia.5052
	Wehbe, N., Mouhib, T., Delcorte, A., Bertrand, P., Moellers, R., Niehuis, E., Houssiau, L. (2014) Comparison of fullerene and large argon clusters for the molecular depth profiling of amino acid multilayers. Analytical and Bioanalytical Chemistry, 406 (1) 201-211 doi:10.1007/s00216-013-7408-x
	Wehbe, Nimer, Houssiau, Laurent (2011) ToF-SIMS depth profiling of vitamin C layers using Cs+ and Xe+ ion beams. Surface and Interface Analysis, 43 (1). 190-193 doi:10.1002/sia.3426
	Mouhib, T., Delcorte, A., Poleunis, C., Henry, M., Bertrand, P. (2010) C60 SIMS depth profiling of bovine serum albumin protein-coating films: a conformational study. Surface and Interface Analysis, 42 (6). 641-644 doi:10.1002/sia.3349
	Delcorte, A., Yunus, S., Wehbe, N., Nieuwjaer, N., Poleunis, C., Felten, A., Houssiau, L., Pireaux, J.-J., Bertrand, P. (2007) Metal-Assisted Secondary Ion Mass Spectrometry Using Atomic (Ga+, In+) and Fullerene Projectiles. Analytical Chemistry, 79 (10). 3673-3689 doi:10.1021/ac062406l
	Heile, A., Lipinsky, D., Wehbe, N., Delcorte, A., Bertrand, P., Felten, A., Houssiau, L., Pireaux, J.-J., De Mondt, R., Van Royen, P., Van Vaeck, L., Arlinghaus, H. F. (2008) Investigation of methods to enhance the secondary ion yields in TOF-SIMS of organic samples. Surface and Interface Analysis, 40 (3). 538-542 doi:10.1002/sia.2810
	Nieuwjaer, N., Poleunis, C., Delcorte, A., Bertrand, P. (2009) Depth profiling of polymer samples using Ga+and C60+ion beams. Surface and Interface Analysis, 41 (1). 6-10 doi:10.1002/sia.2931
	Mouhib, T., Delcorte, A., Poleunis, C., Bertrand, P. (2013) Organic ion yield enhancement in secondary ion mass spectrometry using water vapour injection. Surface and Interface Analysis, 45 (1). 46-49 doi:10.1002/sia.5043
	Heile, A., Lipinsky, D., Wehbe, N., Delcorte, A., Bertrand, P., Felten, A., Houssiau, L., Pireaux, J.-J., De Mondt, R., Van Vaeck, L., Arlinghaus, H.F. (2008) Metal-assisted SIMS and cluster ion bombardment for ion yield enhancement. Applied Surface Science, 255. 941-943 doi:10.1016/j.apsusc.2008.05.007