| Reference Type | Journal (article/letter/editorial) |
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| Title | The influence of defects on response speed of high gain two-beam photogating in a-Si:H PIN structures |
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| Journal | Journal of Non-Crystalline Solids |
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| Authors | Zollondz, J.-H. | Author |
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| Reynolds, S. | Author |
| Main, C. | Author |
| Smirnov, V. | Author |
| Zrinscak, I. | Author |
| Year | 2002 (April) | Volume | 299 |
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| Publisher | Elsevier BV |
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| DOI | doi:10.1016/s0022-3093(01)01204-2Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 640377 | Long-form Identifier | mindat:1:5:640377:9 |
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| GUID | 0 |
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| Full Reference | Zollondz, J.-H., Reynolds, S., Main, C., Smirnov, V., Zrinscak, I. (2002) The influence of defects on response speed of high gain two-beam photogating in a-Si:H PIN structures. Journal of Non-Crystalline Solids, 299. 594-598 doi:10.1016/s0022-3093(01)01204-2 |
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| Plain Text | Zollondz, J.-H., Reynolds, S., Main, C., Smirnov, V., Zrinscak, I. (2002) The influence of defects on response speed of high gain two-beam photogating in a-Si:H PIN structures. Journal of Non-Crystalline Solids, 299. 594-598 doi:10.1016/s0022-3093(01)01204-2 |
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| In | (2002) Journal of Non-Crystalline Solids Vol. 299. Elsevier BV |
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