| Reference Type | Journal (article/letter/editorial) |
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| Title | Probing localized states distributions in semiconductors by Laplace transform transient photocurrent spectroscopy |
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| Journal | Journal of Non-Crystalline Solids |
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| Authors | Gueorguieva, M.J | Author |
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| Main, C | Author |
| Reynolds, S | Author |
| Brüggemann, R | Author |
| Longeaud, C | Author |
| Year | 2002 (April) | Volume | 299 |
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| Publisher | Elsevier BV |
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| DOI | doi:10.1016/s0022-3093(01)00967-xSearch in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 640144 | Long-form Identifier | mindat:1:5:640144:7 |
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| GUID | 0 |
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| Full Reference | Gueorguieva, M.J, Main, C, Reynolds, S, Brüggemann, R, Longeaud, C (2002) Probing localized states distributions in semiconductors by Laplace transform transient photocurrent spectroscopy. Journal of Non-Crystalline Solids, 299. 541-545 doi:10.1016/s0022-3093(01)00967-x |
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| Plain Text | Gueorguieva, M.J, Main, C, Reynolds, S, Brüggemann, R, Longeaud, C (2002) Probing localized states distributions in semiconductors by Laplace transform transient photocurrent spectroscopy. Journal of Non-Crystalline Solids, 299. 541-545 doi:10.1016/s0022-3093(01)00967-x |
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| In | (2002) Journal of Non-Crystalline Solids Vol. 299. Elsevier BV |
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