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Morigaki, K, Niikura, C, Bourée, J.E, Equer, B (2002) Anisotropic magnetic centres in hydrogenated microcrystalline and polymorphous silicon. Journal of Non-Crystalline Solids, 299. 561-565 doi:10.1016/s0022-3093(01)01202-9

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Reference TypeJournal (article/letter/editorial)
TitleAnisotropic magnetic centres in hydrogenated microcrystalline and polymorphous silicon
JournalJournal of Non-Crystalline Solids
AuthorsMorigaki, KAuthor
Niikura, CAuthor
Bourée, J.EAuthor
Equer, BAuthor
Year2002 (April)Volume299
PublisherElsevier BV
DOIdoi:10.1016/s0022-3093(01)01202-9Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID640375Long-form Identifiermindat:1:5:640375:5
GUID0
Full ReferenceMorigaki, K, Niikura, C, Bourée, J.E, Equer, B (2002) Anisotropic magnetic centres in hydrogenated microcrystalline and polymorphous silicon. Journal of Non-Crystalline Solids, 299. 561-565 doi:10.1016/s0022-3093(01)01202-9
Plain TextMorigaki, K, Niikura, C, Bourée, J.E, Equer, B (2002) Anisotropic magnetic centres in hydrogenated microcrystalline and polymorphous silicon. Journal of Non-Crystalline Solids, 299. 561-565 doi:10.1016/s0022-3093(01)01202-9
In(2002) Journal of Non-Crystalline Solids Vol. 299. Elsevier BV

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Garcia-Caurel, E, Niikura, C, Kim, S.Y, Drévillon, B, Bourée, J.E (2002) FTIR phase-modulated ellipsometry measurements of microcrystalline silicon films deposited by hot-wire CVD. Journal of Non-Crystalline Solids, 299. 215-219 doi:10.1016/s0022-3093(01)00950-4
Vignoli, S, Fontcuberta i Morral, A, Butté, R, Meaudre, R, Meaudre, M (2002) Hydrogen related bonding structure in hydrogenated polymorphous and microcrystalline silicon. Journal of Non-Crystalline Solids, 299. 220-225 doi:10.1016/s0022-3093(01)00951-6
Morigaki, K, Hikita, H (2002) Light-induced defect creation under intense optical excitation in hydrogenated amorphous silicon. Journal of Non-Crystalline Solids, 299. 455-459 doi:10.1016/s0022-3093(01)01018-3
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Nickel, N.H, Rakel, M (2002) Metastable defect kinetics in microcrystalline silicon. Journal of Non-Crystalline Solids, 299. 502-506 doi:10.1016/s0022-3093(01)00960-7
Fontcuberta i Morral, A., Hofmeister, H., Roca i Cabarrocas, P. (2002) Structure of plasma-deposited polymorphous silicon. Journal of Non-Crystalline Solids, 299. 284-289 doi:10.1016/s0022-3093(01)01007-9
Meaudre, M, Meaudre, R, Vignoli, S, Marty, O (2002) Density of states in hydrogenated microcrystalline silicon determined by space charge limited currents. Journal of Non-Crystalline Solids, 299. 626-631 doi:10.1016/s0022-3093(01)00970-x
Rerbal, K, Chazalviel, J.-N, Ozanam, F, Solomon, I (2002) Measurement of band tail widths in hydrogenated amorphous silicon. Journal of Non-Crystalline Solids, 299. 585-588 doi:10.1016/s0022-3093(01)01024-9
Bronner, W, Kleider, J.P, Brüggemann, R, Roca i Cabarrocas, P, Mencaraglia, D, Mehring, M (2002) Comparison of transport and defects properties in hydrogenated polymorphous and amorphous silicon. Journal of Non-Crystalline Solids, 299. 551-555 doi:10.1016/s0022-3093(01)01201-7
Globus, T, Roca i Cabarrocas, P, Gelmont, B (2002) Defect-related absorption in hydrogenated silicon films. Journal of Non-Crystalline Solids, 299. 615-620 doi:10.1016/s0022-3093(01)01206-6
 
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