Ofuchi, H, Imaizumi, Y, Sugawara, H, Fujioka, H, Oshima, M, Takeda, Y (2003) Fluorescence XAFS study on local structures around Tb ions implanted in SiO2 on Si. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 199. 231-234 doi:10.1016/s0168-583x(02)01543-4

See Also

These are possibly similar items as determined by title/reference text matching only.

	Ofuchi, H, Mizuguchi, M, Ono, K, Oshima, M, Akinaga, H, Manago, T (2003) Fluorescence extended X-ray absorption fine structure analysis of half-metallic ferromagnet “zinc-blende CrAs” grown on GaAs by molecular beam epitaxy. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 199. 227-230 doi:10.1016/s0168-583x(02)01539-2
	Hanamoto, K, Yoshimoto, H, Hosono, T, Hirai, A, Kido, Y, Nakayama, Y, Kaigawa, R (1998) Anomalous depth profile of implanted fluorine ions in SiO2/Si. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 140 (1). 124-128 doi:10.1016/s0168-583x(98)00107-4
	(2003) Contents. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 199. doi:10.1016/s0168-583x(02)02163-8
	(2003) SYNCHROTRON RADIATION IN MATERIALS SCIENCE. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 199. doi:10.1016/s0168-583x(02)01766-4
	Matsui, J., Tsusaka, Y., Yokoyama, K., Takeda, S., Katou, M., Kurihara, H., Watanabe, K., Kagoshima, Y., Kimura, S. (2003) Measurement of minute local strain in semiconductor materials and electronic devices by using a highly parallel X-ray microbeam. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 199. 15-18 doi:10.1016/s0168-583x(02)01406-4
	(2003) Author index. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 199. 580-592 doi:10.1016/s0168-583x(02)02158-4
	Yan, J., Li, Y.-M., Yao, J.-H. (2003) Configuration interaction effect on dielectronic recombination rate of complex ions. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 205. 382-385 doi:10.1016/s0168-583x(02)01954-7
	Tsuji, H., Arai, N., Motono, M., Gotoh, Y., Adachi, K., Kotaki, H., Ishikawa, J. (2003) Study on optical reflection property from multilayer on Si substrate including nanoparticles in SiO2 layer. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 206. 615-619 doi:10.1016/s0168-583x(03)00795-x
	(2003) Editorial board. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 199. doi:10.1016/s0168-583x(02)02153-5
	Kolobov, A.V., Oyanagi, H., Frenkel, A., Robinson, I., Cross, J., Wei, S., Brunner, K., Abstreiter, G., Maeda, Y., Shklyaev, A., Ichikawa, M., Yamasaki, S., Tanaka, K. (2003) Local structure of Ge/Si nanostructures: Uniqueness of XAFS spectroscopy. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 199. 174-178 doi:10.1016/s0168-583x(02)01556-2
	(2003) Committees and Sponsors. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 199. doi:10.1016/s0168-583x(02)01767-6