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Khoshman, Jebreel M., Kordesch, Martin E. (2007) Aluminum nitride/indium nitride bilayer and multilayer thin film systems as coatings for solar cells and longwave-pass filters. physica status solidi (c), 4 (7). 2846-2849 doi:10.1002/pssc.200674726

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Reference TypeJournal (article/letter/editorial)
TitleAluminum nitride/indium nitride bilayer and multilayer thin film systems as coatings for solar cells and longwave-pass filters
Journalphysica status solidi (c)
AuthorsKhoshman, Jebreel M.Author
Kordesch, Martin E.Author
Year2007 (June)Volume4
Issue7
PublisherWiley
DOIdoi:10.1002/pssc.200674726Search in ResearchGate
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Mindat Ref. ID5114520Long-form Identifiermindat:1:5:5114520:2
GUID0
Full ReferenceKhoshman, Jebreel M., Kordesch, Martin E. (2007) Aluminum nitride/indium nitride bilayer and multilayer thin film systems as coatings for solar cells and longwave-pass filters. physica status solidi (c), 4 (7). 2846-2849 doi:10.1002/pssc.200674726
Plain TextKhoshman, Jebreel M., Kordesch, Martin E. (2007) Aluminum nitride/indium nitride bilayer and multilayer thin film systems as coatings for solar cells and longwave-pass filters. physica status solidi (c), 4 (7). 2846-2849 doi:10.1002/pssc.200674726
In(2007, June) physica status solidi (c) Vol. 4 (7) Wiley

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Khoshman, Jebreel M., Kordesch, Martin E. (2005) Spectroscopic ellipsometry characterization of amorphous aluminum nitride and indium nitride thin films. physica status solidi (c), 2 (7). 2821-2827 doi:10.1002/pssc.200461331
Khoshman, Jebreel M., Kordesch, Martin E. (2005) Optical characterization of sputtered amorphous aluminum nitride thin films by spectroscopic ellipsometry. Journal of Non-Crystalline Solids, 351 (40) 3334-3340 doi:10.1016/j.jnoncrysol.2005.08.009
Pandya, Sneha G., Kordesch, Martin E. (2014) Luminescence of erbium doped aluminum nitride nanoparticles synthesized using inert gas condensation. physica status solidi (c), 11 (3). 483-486 doi:10.1002/pssc.201300487
Kazan, M., Moussaed, E., Nader, R., Masri, P. (2007) Elastic constants of aluminum nitride. physica status solidi (c), 4 (1). 204-207 doi:10.1002/pssc.200673503
Ruterana, Pierre (2012) Preface: Indium nitride and related alloys. physica status solidi (c), 9 (3). 976 doi:10.1002/pssc.201260135
Khoshman, Jebreel M., Kordesch, Martin E. (2006) Optical absorption in amorphous InN thin films. Journal of Non-Crystalline Solids, 352 (52) 5572-5577 doi:10.1016/j.jnoncrysol.2006.09.011
Bickermann, M., Schmidt, S., Epelbaum, B. M., Heimann, P., Nagata, S., Winnacker, A. (2007) Defect-selective etching of aluminum nitride single crystals. physica status solidi (c), 4 (7). 2609-2612 doi:10.1002/pssc.200674724
Anderson, P. A., Kendrick, C. E., Kinsey, R. J., Asadov, A., Gao, W., Reeves, R. J., Durbin, S. M. (2005) (111) and (100) YSZ as substrates for indium nitride growth. physica status solidi (c), 2 (7). 2320-2323 doi:10.1002/pssc.200461336
Khoshman, J. M., Khan, A., Kordesch, M. E. (2007) Optical properties of sputtered amorphous beryllium nitride thin films. Journal of Applied Physics, 101 (10). 103532pp. doi:10.1063/1.2738393
Wintrebert-Fouquet, M., Butcher, K. S. A., Chen, P. P.-T., Wuhrer, R. (2007) Nitride film growth morphology using remote plasma enhanced chemical vapor deposition. physica status solidi (c), 4 (7). 2285-2288 doi:10.1002/pssc.200674728
Bhattacharyya, S. R., Ayouchi, R., Pinnisch, M., Schwarz, R. (2012) Transfer characteristic of zinc nitride based thin film transistors. physica status solidi (c), 9 (3). 469-472 doi:10.1002/pssc.201100802
 
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