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Khoshman, Jebreel M., Kordesch, Martin E. (2005) Optical characterization of sputtered amorphous aluminum nitride thin films by spectroscopic ellipsometry. Journal of Non-Crystalline Solids, 351 (40) 3334-3340 doi:10.1016/j.jnoncrysol.2005.08.009

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Reference TypeJournal (article/letter/editorial)
TitleOptical characterization of sputtered amorphous aluminum nitride thin films by spectroscopic ellipsometry
JournalJournal of Non-Crystalline Solids
AuthorsKhoshman, Jebreel M.Author
Kordesch, Martin E.Author
Year2005 (October)Volume351
Issue40
PublisherElsevier BV
DOIdoi:10.1016/j.jnoncrysol.2005.08.009Search in ResearchGate
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Mindat Ref. ID643268Long-form Identifiermindat:1:5:643268:7
GUID0
Full ReferenceKhoshman, Jebreel M., Kordesch, Martin E. (2005) Optical characterization of sputtered amorphous aluminum nitride thin films by spectroscopic ellipsometry. Journal of Non-Crystalline Solids, 351 (40) 3334-3340 doi:10.1016/j.jnoncrysol.2005.08.009
Plain TextKhoshman, Jebreel M., Kordesch, Martin E. (2005) Optical characterization of sputtered amorphous aluminum nitride thin films by spectroscopic ellipsometry. Journal of Non-Crystalline Solids, 351 (40) 3334-3340 doi:10.1016/j.jnoncrysol.2005.08.009
In(2005, October) Journal of Non-Crystalline Solids Vol. 351 (40) Elsevier BV

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Khoshman, Jebreel M., Kordesch, Martin E. (2005) Spectroscopic ellipsometry characterization of amorphous aluminum nitride and indium nitride thin films. physica status solidi (c), 2 (7). 2821-2827 doi:10.1002/pssc.200461331
Khoshman, Jebreel M., Kordesch, Martin E. (2006) Optical absorption in amorphous InN thin films. Journal of Non-Crystalline Solids, 352 (52) 5572-5577 doi:10.1016/j.jnoncrysol.2006.09.011
Khoshman, J.M., Ingram, D.C., Kordesch, M.E. (2008) Growth and optical properties of amorphous Be0.13Zn0.38O0.49 thin films prepared by radio frequency magnetron sputtering. Journal of Non-Crystalline Solids, 354 (19) 2783-2786 doi:10.1016/j.jnoncrysol.2007.09.061
Khoshman, J. M., Khan, A., Kordesch, M. E. (2007) Optical properties of sputtered amorphous beryllium nitride thin films. Journal of Applied Physics, 101 (10). 103532pp. doi:10.1063/1.2738393
Khoshman, Jebreel M., Kordesch, Martin E. (2007) Aluminum nitride/indium nitride bilayer and multilayer thin film systems as coatings for solar cells and longwave-pass filters. physica status solidi (c), 4 (7). 2846-2849 doi:10.1002/pssc.200674726
Khoshman, J.M., Jakkala, P., Ingram, D.C., Kordesch, M.E. (2016) Optical conductivity tuning and electrical properties of a-Be x Zn y O thin films. Journal of Non-Crystalline Solids, 440. 31-37 doi:10.1016/j.jnoncrysol.2016.03.005
Atay, F., Bilgin, V., Akyuz, I., Ketenci, E., Kose, S. (2010) Optical characterization of SnO2:F films by spectroscopic ellipsometry. Journal of Non-Crystalline Solids, 356 (41) 2192-2197 doi:10.1016/j.jnoncrysol.2010.07.007
Vassilev, V., Boycheva, S., Popov, C., Petkov, P., Aljihmani, L., Monchev, B., Kolev, K. (2005) Optical characterization of As2Se3–Ag4SSe–SnTe amorphous thin films. Journal of Non-Crystalline Solids, 351 (4) 299-303 doi:10.1016/j.jnoncrysol.2004.11.012
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