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Zhang, Z. G., Li, C., Ge, S. H. (1999) Investigation on the Magnetic Interaction between Neighboring Grains in Insulating Granular Film of Co54Al19O27. physica status solidi (a), 171 (1). doi:10.1002/(sici)1521-396x(199901)171:13.0.co;2-2

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Reference TypeJournal (article/letter/editorial)
TitleInvestigation on the Magnetic Interaction between Neighboring Grains in Insulating Granular Film of Co54Al19O27
Journalphysica status solidi (a)
AuthorsZhang, Z. G.Author
Li, C.Author
Ge, S. H.Author
Year1999 (January)Volume171
Issue1
PublisherWiley
DOIdoi:10.1002/(sici)1521-396x(199901)171:13.0.co;2-2Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5084073Long-form Identifiermindat:1:5:5084073:5
GUID0
Full ReferenceZhang, Z. G., Li, C., Ge, S. H. (1999) Investigation on the Magnetic Interaction between Neighboring Grains in Insulating Granular Film of Co54Al19O27. physica status solidi (a), 171 (1). doi:10.1002/(sici)1521-396x(199901)171:13.0.co;2-2
Plain TextZhang, Z. G., Li, C., Ge, S. H. (1999) Investigation on the Magnetic Interaction between Neighboring Grains in Insulating Granular Film of Co54Al19O27. physica status solidi (a), 171 (1). doi:10.1002/(sici)1521-396x(199901)171:13.0.co;2-2
In(1999, January) physica status solidi (a) Vol. 171 (1) Wiley

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Mil'shtein, S. (1999) Dislocations in Microelectronics. physica status solidi (a), 171 (1). 371-376 doi:10.1002/(sici)1521-396x(199901)171:1<371::aid-pssa371>3.0.co;2-y
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Sumino, K. (1999) Impurity Reaction with Dislocations in Semiconductors. physica status solidi (a), 171 (1). 111-122 doi:10.1002/(sici)1521-396x(199901)171:1<111::aid-pssa111>3.0.co;2-t
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Pizzini, S. (1999) Chemistry and Physics of Segregation of Impurities at Extended Defects in Silicon. physica status solidi (a), 171 (1). 123-132 doi:10.1002/(sici)1521-396x(199901)171:1<123::aid-pssa123>3.0.co;2-h
Takeuchi, S., Suzuki, K. (1999) Stacking Fault Energies of Tetrahedrally Coordinated Crystals. physica status solidi (a), 171 (1). 99-103 doi:10.1002/(sici)1521-396x(199901)171:1<99::aid-pssa99>3.0.co;2-b
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Misiuk, A. (1999) Effect of Stress on Creation of Defects in Annealed Czochralski Grown Silicon. physica status solidi (a), 171 (1). 191-196 doi:10.1002/(sici)1521-396x(199901)171:1<191::aid-pssa191>3.0.co;2-y
 
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