Stratton, W.G., Voyles, P.M. (2008) A phenomenological model of fluctuation electron microscopy for a nanocrystal/amorphous composite. Ultramicroscopy, 108 (8). 727-736 doi:10.1016/j.ultramic.2007.11.004
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | A phenomenological model of fluctuation electron microscopy for a nanocrystal/amorphous composite | ||
| Journal | Ultramicroscopy | ||
| Authors | Stratton, W.G. | Author | |
| Voyles, P.M. | Author | ||
| Year | 2008 (July) | Volume | 108 |
| Issue | 8 | ||
| Publisher | Elsevier BV | ||
| DOI | doi:10.1016/j.ultramic.2007.11.004Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 4904795 | Long-form Identifier | mindat:1:5:4904795:2 |
| GUID | 0 | ||
| Full Reference | Stratton, W.G., Voyles, P.M. (2008) A phenomenological model of fluctuation electron microscopy for a nanocrystal/amorphous composite. Ultramicroscopy, 108 (8). 727-736 doi:10.1016/j.ultramic.2007.11.004 | ||
| Plain Text | Stratton, W.G., Voyles, P.M. (2008) A phenomenological model of fluctuation electron microscopy for a nanocrystal/amorphous composite. Ultramicroscopy, 108 (8). 727-736 doi:10.1016/j.ultramic.2007.11.004 | ||
| In | (2008, July) Ultramicroscopy Vol. 108 (8) Elsevier BV | ||
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