Yi, Feng, Voyles, P.M. (2012) Analytical and computational modeling of fluctuation electron microscopy from a nanocrystal/amorphous composite. Ultramicroscopy, 122. 37-47 doi:10.1016/j.ultramic.2012.07.022
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Analytical and computational modeling of fluctuation electron microscopy from a nanocrystal/amorphous composite | ||
| Journal | Ultramicroscopy | ||
| Authors | Yi, Feng | Author | |
| Voyles, P.M. | Author | ||
| Year | 2012 (November) | Volume | 122 |
| Publisher | Elsevier BV | ||
| DOI | doi:10.1016/j.ultramic.2012.07.022Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 4907798 | Long-form Identifier | mindat:1:5:4907798:0 |
| GUID | 0 | ||
| Full Reference | Yi, Feng, Voyles, P.M. (2012) Analytical and computational modeling of fluctuation electron microscopy from a nanocrystal/amorphous composite. Ultramicroscopy, 122. 37-47 doi:10.1016/j.ultramic.2012.07.022 | ||
| Plain Text | Yi, Feng, Voyles, P.M. (2012) Analytical and computational modeling of fluctuation electron microscopy from a nanocrystal/amorphous composite. Ultramicroscopy, 122. 37-47 doi:10.1016/j.ultramic.2012.07.022 | ||
| In | (2012) Ultramicroscopy Vol. 122. Elsevier BV | ||
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