O’Keefe, Michael A. (2008) Seeing atoms with aberration-corrected sub-Ångström electron microscopy. Ultramicroscopy, 108 (3). 196-209 doi:10.1016/j.ultramic.2007.07.009

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Reference Type	Journal (article/letter/editorial)
Title	Seeing atoms with aberration-corrected sub-Ångström electron microscopy
Journal	Ultramicroscopy
Authors	O’Keefe, Michael A.		Author
Year	2008 (February)	Volume	108
Issue	3
Publisher	Elsevier BV
DOI	doi:10.1016/j.ultramic.2007.07.009Search in ResearchGate
	Generate Citation Formats
Mindat Ref. ID	4904571	Long-form Identifier	mindat:1:5:4904571:4
GUID	0
Full Reference	O’Keefe, Michael A. (2008) Seeing atoms with aberration-corrected sub-Ångström electron microscopy. Ultramicroscopy, 108 (3). 196-209 doi:10.1016/j.ultramic.2007.07.009
Plain Text	O’Keefe, Michael A. (2008) Seeing atoms with aberration-corrected sub-Ångström electron microscopy. Ultramicroscopy, 108 (3). 196-209 doi:10.1016/j.ultramic.2007.07.009
In	(2008, February) Ultramicroscopy Vol. 108 (3) Elsevier BV

	*O'Keefe, Michael A. (2004) Seeing Atoms at Sub-Ångstrom Resolution with Aberration-Corrected TEM. Microscopy and Microanalysis, 10. 972-973 doi:10.1017/s1431927604881868*
	*Hettler, Simon, Arenal, Raul (2022) Aberration-corrected transmission electron microscopy with Zernike phase plates. Ultramicroscopy, 239. 113564 doi:10.1016/j.ultramic.2022.113564*
	Evans, James E., Hetherington, Crispin, Kirkland, Angus, Chang, Lan-Yun, Stahlberg, Henning, Browning, Nigel (2008) Low-dose aberration corrected cryo-electron microscopy of organic specimens. Ultramicroscopy, 108 (12). 1636-1644 doi:10.1016/j.ultramic.2008.06.004
	*Allen, L.J. (2017) Simulation in elemental mapping using aberration-corrected electron microscopy. Ultramicroscopy, 180. 142-149 doi:10.1016/j.ultramic.2017.03.001*
	Cosgriff, E.C., D’Alfonso, A.J., Allen, L.J., Findlay, S.D., Kirkland, A.I., Nellist, P.D. (2008) Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part I:. Ultramicroscopy, 108 (12). 1558-1566 doi:10.1016/j.ultramic.2008.05.009
	Intaraprasonk, Varat, Xin, Huolin L., Muller, David A. (2008) Analytic derivation of optimal imaging conditions for incoherent imaging in aberration-corrected electron microscopes. Ultramicroscopy, 108 (11). 1454-1466 doi:10.1016/j.ultramic.2008.05.013
	*Isaacson, Michael S. (2012) Seeing single atoms. Ultramicroscopy, 123. 3-12 doi:10.1016/j.ultramic.2012.06.009*
	D’Alfonso, A.J., Cosgriff, E.C., Findlay, S.D., Behan, G., Kirkland, A.I., Nellist, P.D., Allen, L.J. (2008) Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part II: Inelastic scattering. Ultramicroscopy, 108 (12). 1567-1578 doi:10.1016/j.ultramic.2008.05.007
	*Yu, R., Lentzen, M., Zhu, J. (2012) Effective object planes for aberration-corrected transmission electron microscopy. Ultramicroscopy, 112 (1). 15-21 doi:10.1016/j.ultramic.2011.10.006*
	Gamm, B., Schultheiß, K., Gerthsen, D., Schröder, R.R. (2008) Effect of a physical phase plate on contrast transfer in an aberration-corrected transmission electron microscope. Ultramicroscopy, 108 (9). 878-884 doi:10.1016/j.ultramic.2008.02.009
	Krivanek, O.L., Corbin, G.J., Dellby, N., Elston, B.F., Keyse, R.J., Murfitt, M.F., Own, C.S., Szilagyi, Z.S., Woodruff, J.W. (2008) An electron microscope for the aberration-corrected era. Ultramicroscopy, 108 (3). 179-195 doi:10.1016/j.ultramic.2007.07.010

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O’Keefe, Michael A. (2008) Seeing atoms with aberration-corrected sub-Ångström electron microscopy. Ultramicroscopy, 108 (3). 196-209 doi:10.1016/j.ultramic.2007.07.009

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