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Zhang, Daliang, Liu, Lingmei, Zhu, Yihan, Han, Yu (2019) Advancing Atomic-Resolution TEM of Electron Beam-Sensitive Crystalline Materials from “Impossible” to “Routine”. Microscopy and Microanalysis, 25. 1676-1677 doi:10.1017/s1431927619009115

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Reference TypeJournal (article/letter/editorial)
TitleAdvancing Atomic-Resolution TEM of Electron Beam-Sensitive Crystalline Materials from “Impossible” to “Routine”
JournalMicroscopy and Microanalysis
AuthorsZhang, DaliangAuthor
Liu, LingmeiAuthor
Zhu, YihanAuthor
Han, YuAuthor
Year2019 (August)Volume25
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927619009115Search in ResearchGate
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Mindat Ref. ID4887393Long-form Identifiermindat:1:5:4887393:4
GUID0
Full ReferenceZhang, Daliang, Liu, Lingmei, Zhu, Yihan, Han, Yu (2019) Advancing Atomic-Resolution TEM of Electron Beam-Sensitive Crystalline Materials from “Impossible” to “Routine”. Microscopy and Microanalysis, 25. 1676-1677 doi:10.1017/s1431927619009115
Plain TextZhang, Daliang, Liu, Lingmei, Zhu, Yihan, Han, Yu (2019) Advancing Atomic-Resolution TEM of Electron Beam-Sensitive Crystalline Materials from “Impossible” to “Routine”. Microscopy and Microanalysis, 25. 1676-1677 doi:10.1017/s1431927619009115
In(2019) Microscopy and Microanalysis Vol. 25. Cambridge University Press (CUP)

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Zhang, Daliang, Zhu, Yihan, Liu, Lingmei, Ying, Xiangrong, Hsiung, Chia-En, Sougrat, Rachid, Li, Kun, Han, Yu (2018) Atomic-resolution transmission electron microscopy of electron beam–sensitive crystalline materials. Science, 359 (6376). 675-679 doi:10.1126/science.aao0865
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Nicolopoulos, S, Gomez, A, Das, PP (2019) Electron Crystallography in the Age of Pixelated Detectors: From Crystalline/Amorphous Organic Structural Models and Phase Mapping of Beam Sensitive Materials. Microscopy and Microanalysis, 25. 1948-1949 doi:10.1017/s143192761901047x
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