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Zhang, Daliang, Wei, Nini, Liu, Lingmei, Song, Kepeng, Behzad, Ali, Genovese, Alessandro, Han, Yu (2019) Cryo Focused Ion Beam Applications in High Resolution Electron Microscopy Studies of Beam Sensitive Crystals. Microscopy and Microanalysis, 25. 1402-1403 doi:10.1017/s1431927619007748

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Reference TypeJournal (article/letter/editorial)
TitleCryo Focused Ion Beam Applications in High Resolution Electron Microscopy Studies of Beam Sensitive Crystals
JournalMicroscopy and Microanalysis
AuthorsZhang, DaliangAuthor
Wei, NiniAuthor
Liu, LingmeiAuthor
Song, KepengAuthor
Behzad, AliAuthor
Genovese, AlessandroAuthor
Han, YuAuthor
Year2019 (August)Volume25
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927619007748Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4887110Long-form Identifiermindat:1:5:4887110:3
GUID0
Full ReferenceZhang, Daliang, Wei, Nini, Liu, Lingmei, Song, Kepeng, Behzad, Ali, Genovese, Alessandro, Han, Yu (2019) Cryo Focused Ion Beam Applications in High Resolution Electron Microscopy Studies of Beam Sensitive Crystals. Microscopy and Microanalysis, 25. 1402-1403 doi:10.1017/s1431927619007748
Plain TextZhang, Daliang, Wei, Nini, Liu, Lingmei, Song, Kepeng, Behzad, Ali, Genovese, Alessandro, Han, Yu (2019) Cryo Focused Ion Beam Applications in High Resolution Electron Microscopy Studies of Beam Sensitive Crystals. Microscopy and Microanalysis, 25. 1402-1403 doi:10.1017/s1431927619007748
In(2019) Microscopy and Microanalysis Vol. 25. Cambridge University Press (CUP)

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