Zhang, Daliang, Zhu, Yihan, Liu, Lingmei, Ying, Xiangrong, Hsiung, Chia-En, Sougrat, Rachid, Li, Kun, Han, Yu (2018) Atomic-resolution transmission electron microscopy of electron beam–sensitive crystalline materials. Science, 359 (6376). 675-679 doi:10.1126/science.aao0865
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Atomic-resolution transmission electron microscopy of electron beam–sensitive crystalline materials | ||
| Journal | Science | ||
| Authors | Zhang, Daliang | Author | |
| Zhu, Yihan | Author | ||
| Liu, Lingmei | Author | ||
| Ying, Xiangrong | Author | ||
| Hsiung, Chia-En | Author | ||
| Sougrat, Rachid | Author | ||
| Li, Kun | Author | ||
| Han, Yu | Author | ||
| Year | 2018 (February 9) | Volume | 359 |
| Issue | 6376 | ||
| Publisher | American Association for the Advancement of Science (AAAS) | ||
| DOI | doi:10.1126/science.aao0865Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 2836656 | Long-form Identifier | mindat:1:5:2836656:0 |
| GUID | 0 | ||
| Full Reference | Zhang, Daliang, Zhu, Yihan, Liu, Lingmei, Ying, Xiangrong, Hsiung, Chia-En, Sougrat, Rachid, Li, Kun, Han, Yu (2018) Atomic-resolution transmission electron microscopy of electron beam–sensitive crystalline materials. Science, 359 (6376). 675-679 doi:10.1126/science.aao0865 | ||
| Plain Text | Zhang, Daliang, Zhu, Yihan, Liu, Lingmei, Ying, Xiangrong, Hsiung, Chia-En, Sougrat, Rachid, Li, Kun, Han, Yu (2018) Atomic-resolution transmission electron microscopy of electron beam–sensitive crystalline materials. Science, 359 (6376). 675-679 doi:10.1126/science.aao0865 | ||
| In | (2018, February) Science Vol. 359 (6376) American Association for the Advancement of Science (AAAS) | ||
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