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Panzenbock, Michael (2018) Scanning Electron Microscope, an Essential Equipment for Failure Analysis. Microscopy and Microanalysis, 24. 702-703 doi:10.1017/s1431927618004002

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Reference TypeJournal (article/letter/editorial)
TitleScanning Electron Microscope, an Essential Equipment for Failure Analysis
JournalMicroscopy and Microanalysis
AuthorsPanzenbock, MichaelAuthor
Year2018 (August)Volume24
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927618004002Search in ResearchGate
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Mindat Ref. ID4883050Long-form Identifiermindat:1:5:4883050:4
GUID0
Full ReferencePanzenbock, Michael (2018) Scanning Electron Microscope, an Essential Equipment for Failure Analysis. Microscopy and Microanalysis, 24. 702-703 doi:10.1017/s1431927618004002
Plain TextPanzenbock, Michael (2018) Scanning Electron Microscope, an Essential Equipment for Failure Analysis. Microscopy and Microanalysis, 24. 702-703 doi:10.1017/s1431927618004002
In(2018) Microscopy and Microanalysis Vol. 24. Cambridge University Press (CUP)

See Also

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Panzenbock, Michael, Mendez-Martin, Francisca, Rashkova, Boryana, Schutz, Patric (2015) Metallography - A Powerful Instrument for Material Characterisation, Material Development and Failure Analysis. Microscopy and Microanalysis, 21. 771-772 doi:10.1017/s1431927615004651
Boyer, Michael A. (2018) Scanning Electron Microscopy in High School Engineering Research. Microscopy and Microanalysis, 24. 2348-2349 doi:10.1017/s1431927618012229
Sun, Cheng, Müller, Erich, Meffert, Matthias, Gerthsen, Dagmar (2018) On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope. Microscopy and Microanalysis, 24 (2). 99-106 doi:10.1017/s1431927618000181
Heady, WE (2006) Using Metallography,Scanning Electron Microscope and Energy Dispersive Spectroscopy Techniques to enhance failure analysis on aerospace componets. Microscopy and Microanalysis, 12. 196-197 doi:10.1017/s1431927606068061
Johnson, DH (2007) Scanning Electron Microscopy in Failure Analysis and Aircraft Mishap Investigation. Microscopy and Microanalysis, 13. doi:10.1017/s1431927607079482
Caplins, Benjamin W., Holm, Jason D., Keller, Robert R. (2018) Developing a Programmable STEM Detector for the Scanning Electron Microscope. Microscopy and Microanalysis, 24. 658-659 doi:10.1017/s1431927618003781
Vetráková, Ľubica, Nedéla, Vilém, Runštuk, Jiří (2018) In-situ Observation of Lyophilization Process in Environmental Scanning Electron Microscope. Microscopy and Microanalysis, 24. 1406-1407 doi:10.1017/s1431927618007511
Zechmann, Bernd (2018) Beam Deceleration Leads to Superior Image Quality of Biological Samples Analyzed in the Scanning Electron Microscope. Microscopy and Microanalysis, 24. 688-689 doi:10.1017/s1431927618003938
Kellogg, William, Myers, Benjamin D., Hujsak, Karl, Dravid, Vinayak P. (2018) Investigation of Electron Beam Deposition Parameters Within a Scanning Electron Microscope. Microscopy and Microanalysis, 24. 278-279 doi:10.1017/s1431927618001885
Marienhoff, P (2007) Development of Electron Detectors for the Large-Chamber Scanning Electron Microscope. Microscopy and Microanalysis, 13. doi:10.1017/s143192760707448x
Yang, Hyun Jong, Oh, Moohyun, Jang, Jonggyu, Lyu, Hyeonsu, Lee, Junhee (2020) Robust Deep-learning Based Autofocus Score Prediction for Scanning Electron Microscope. Microscopy and Microanalysis, 26. 702-705 doi:10.1017/s1431927620015573
 
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