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Kellogg, William, Myers, Benjamin D., Hujsak, Karl, Dravid, Vinayak P. (2018) Investigation of Electron Beam Deposition Parameters Within a Scanning Electron Microscope. Microscopy and Microanalysis, 24. 278-279 doi:10.1017/s1431927618001885

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Reference TypeJournal (article/letter/editorial)
TitleInvestigation of Electron Beam Deposition Parameters Within a Scanning Electron Microscope
JournalMicroscopy and Microanalysis
AuthorsKellogg, WilliamAuthor
Myers, Benjamin D.Author
Hujsak, KarlAuthor
Dravid, Vinayak P.Author
Year2018 (August)Volume24
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927618001885Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4882601Long-form Identifiermindat:1:5:4882601:5
GUID0
Full ReferenceKellogg, William, Myers, Benjamin D., Hujsak, Karl, Dravid, Vinayak P. (2018) Investigation of Electron Beam Deposition Parameters Within a Scanning Electron Microscope. Microscopy and Microanalysis, 24. 278-279 doi:10.1017/s1431927618001885
Plain TextKellogg, William, Myers, Benjamin D., Hujsak, Karl, Dravid, Vinayak P. (2018) Investigation of Electron Beam Deposition Parameters Within a Scanning Electron Microscope. Microscopy and Microanalysis, 24. 278-279 doi:10.1017/s1431927618001885
In(2018) Microscopy and Microanalysis Vol. 24. Cambridge University Press (CUP)

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Myers, Benjamin D., Hujsak, Karl A., Dravid, Vinayak P. (2018) Orientation Mapping by Electron Channeling (OMEC) and Hybrid Stage/Beam-Rocked Electron Channeling Patterns. Microscopy and Microanalysis, 24. 634-635 doi:10.1017/s1431927618003665
Hujsak, Karl A., Myers, Benjamin D., Dravid, Vinayak P. (2018) Orientation Mapping by Electron Channeling (OMEC) of Polycrystals Using a Stage-Rocked Big-Data Approach. Microscopy and Microanalysis, 24. 584-585 doi:10.1017/s1431927618003410
Hujsak, Karl, Myers, Benjamin D., Roth, Eric, Li, Yue, Dravid, Vinayak P. (2016) Suppressing Electron Exposure Artifacts: An Electron Scanning Paradigm with Bayesian Machine Learning. Microscopy and Microanalysis, 22 (4). 778-788 doi:10.1017/s1431927616011417
Hujsak, Karl A., Roth, Eric, Kellogg, William, Drummy, Lawrence F., Dravid, Vinayak P. (2018) High Speed/Low Dose Analytical Electron Microscopy with Machine Learning and Multi-Objective Dynamic Sampling. Microscopy and Microanalysis, 24. 1954-1955 doi:10.1017/s1431927618010255
Hujsak, Karl, Myers, Benjamin D., Roth, Eric, Li, Yue, Dravid, Vinayak P. (2016) Reducing Electron Dose and Sample Damage with Bayesian Machine Learning and Self-Organizing Neural Networks. Microscopy and Microanalysis, 22. 1434-1435 doi:10.1017/s1431927616008011
Myers, Benjamin D., Lin, Qingyuan, O’Brien, Matthew, Mirkin, Chad A., Dravid, Vinayak P. (2016) Temperature-Controlled Fluidic-Cell Scanning Electron Microscopy. Microscopy and Microanalysis, 22. 764-765 doi:10.1017/s1431927616004670
Hujsak, Karl A., Myers, Benjamin D., Grovogui, Jann, Dravid, Vinayak P. (2018) Stage-Rocked Electron Channeling for Crystal Orientation Mapping. Scientific Reports, 8. doi:10.1038/s41598-018-23413-3
Hujsak, Karl, Dravid, Vinayak P. (2016) Self–Organizing Neural Networks: Parallels Between “Big Imaging” and Sparse Imaging in Electron Microscopy. Microscopy and Microanalysis, 22. 534-535 doi:10.1017/s1431927616003524
Hujsak, Karl A., Stevens, Andrew, Kovarik, Libor, Liyu, Andrey, Browning, Nigel D., Dravid, Vinayak P. (2018) Increasing the Speed of EELS/EDS Mapping Through Dynamic/Adaptive Sampling Methodologies. Microscopy and Microanalysis, 24. 484-485 doi:10.1017/s143192761800291x
Li, Yue, Hujsak, Karl A., Backman, Vadim, Draivid, Vinayak P. (2018) Inpainting Assisted Controlled Rotation Tomography (CORT). Microscopy and Microanalysis, 24. 502-503 doi:10.1017/s1431927618003008
Caplins, Benjamin W., Holm, Jason D., Keller, Robert R. (2018) Developing a Programmable STEM Detector for the Scanning Electron Microscope. Microscopy and Microanalysis, 24. 658-659 doi:10.1017/s1431927618003781
 
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