Hujsak, Karl, Myers, Benjamin D., Roth, Eric, Li, Yue, Dravid, Vinayak P. (2016) Reducing Electron Dose and Sample Damage with Bayesian Machine Learning and Self-Organizing Neural Networks. Microscopy and Microanalysis, 22. 1434-1435 doi:10.1017/s1431927616008011
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Reducing Electron Dose and Sample Damage with Bayesian Machine Learning and Self-Organizing Neural Networks | ||
| Journal | Microscopy and Microanalysis | ||
| Authors | Hujsak, Karl | Author | |
| Myers, Benjamin D. | Author | ||
| Roth, Eric | Author | ||
| Li, Yue | Author | ||
| Dravid, Vinayak P. | Author | ||
| Year | 2016 (July) | Volume | 22 |
| Publisher | Cambridge University Press (CUP) | ||
| DOI | doi:10.1017/s1431927616008011Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 4878166 | Long-form Identifier | mindat:1:5:4878166:0 |
| GUID | 0 | ||
| Full Reference | Hujsak, Karl, Myers, Benjamin D., Roth, Eric, Li, Yue, Dravid, Vinayak P. (2016) Reducing Electron Dose and Sample Damage with Bayesian Machine Learning and Self-Organizing Neural Networks. Microscopy and Microanalysis, 22. 1434-1435 doi:10.1017/s1431927616008011 | ||
| Plain Text | Hujsak, Karl, Myers, Benjamin D., Roth, Eric, Li, Yue, Dravid, Vinayak P. (2016) Reducing Electron Dose and Sample Damage with Bayesian Machine Learning and Self-Organizing Neural Networks. Microscopy and Microanalysis, 22. 1434-1435 doi:10.1017/s1431927616008011 | ||
| In | (2016) Microscopy and Microanalysis Vol. 22. Cambridge University Press (CUP) | ||
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