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Caplins, Benjamin W., Holm, Jason D., Keller, Robert R. (2018) Developing a Programmable STEM Detector for the Scanning Electron Microscope. Microscopy and Microanalysis, 24. 658-659 doi:10.1017/s1431927618003781

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Reference TypeJournal (article/letter/editorial)
TitleDeveloping a Programmable STEM Detector for the Scanning Electron Microscope
JournalMicroscopy and Microanalysis
AuthorsCaplins, Benjamin W.Author
Holm, Jason D.Author
Keller, Robert R.Author
Year2018 (August)Volume24
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927618003781Search in ResearchGate
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Mindat Ref. ID4883006Long-form Identifiermindat:1:5:4883006:3
GUID0
Full ReferenceCaplins, Benjamin W., Holm, Jason D., Keller, Robert R. (2018) Developing a Programmable STEM Detector for the Scanning Electron Microscope. Microscopy and Microanalysis, 24. 658-659 doi:10.1017/s1431927618003781
Plain TextCaplins, Benjamin W., Holm, Jason D., Keller, Robert R. (2018) Developing a Programmable STEM Detector for the Scanning Electron Microscope. Microscopy and Microanalysis, 24. 658-659 doi:10.1017/s1431927618003781
In(2018) Microscopy and Microanalysis Vol. 24. Cambridge University Press (CUP)

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Caplins, Benjamin W., Holm, Jason D., Keller, Robert R. (2019) Transmission imaging with a programmable detector in a scanning electron microscope. Ultramicroscopy, 196. 40-48 doi:10.1016/j.ultramic.2018.09.006
Caplins, Benjamin W., White, Ryan M., Holm, Jason D., Keller, Robert R. (2019) A Workflow for Imaging 2D Materials using 4D STEM-in-SEM. Microscopy and Microanalysis, 25. 218-219 doi:10.1017/s143192761900182x
Caplins, Benjamin W., Holm, Jason D., Keller, Robert R. (2019) Orientation mapping of graphene in a scanning electron microscope. Carbon, 149. 400-406 doi:10.1016/j.carbon.2019.04.042
Holm, Jason, Keller, Robert (2015) Analytical Transmission Scanning Electron Microscopy: Extending the Capabilities of a Conventional SEM Using an Off-the-Shelf Transmission Detector. Microscopy and Microanalysis, 21. 1867-1868 doi:10.1017/s1431927615010119
Caplins, Benjamin W., Holm, Jason D., White, Ryan M., Keller, Robert R. (2020) Orientation mapping of graphene using 4D STEM-in-SEM. Ultramicroscopy, 219. 113137pp. doi:10.1016/j.ultramic.2020.113137
Woehl, Taylor, Holm, Jason, Keller, Robert (2015) An Analytical Scattering Model for Low Energy Annular Dark Field Transmission Scanning Electron Microscopy. Microscopy and Microanalysis, 21. 1263-1264 doi:10.1017/s1431927615007102
Sun, Cheng, Müller, Erich, Meffert, Matthias, Gerthsen, Dagmar (2018) On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope. Microscopy and Microanalysis, 24 (2). 99-106 doi:10.1017/s1431927618000181
Kellogg, William, Myers, Benjamin D., Hujsak, Karl, Dravid, Vinayak P. (2018) Investigation of Electron Beam Deposition Parameters Within a Scanning Electron Microscope. Microscopy and Microanalysis, 24. 278-279 doi:10.1017/s1431927618001885
Holm, Jason, Keller, Robert R. (2016) Angularly-selective transmission imaging in a scanning electron microscope. Ultramicroscopy, 167. 43-56 doi:10.1016/j.ultramic.2016.05.001
Spoth, Katherine A., Muller, David A., Kourkoutis, Lena F. (2018) Cryo-STEM Imaging of Ribosomes Using the Electron Microscope Pixel Array Detector. Microscopy and Microanalysis, 24. 876-877 doi:10.1017/s1431927618004877
Chuah, J, Holburn, D (2011) Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope. Microscopy and Microanalysis, 17. 1212-1213 doi:10.1017/s1431927611006933
 
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