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Woehl, Taylor, Holm, Jason, Keller, Robert (2015) An Analytical Scattering Model for Low Energy Annular Dark Field Transmission Scanning Electron Microscopy. Microscopy and Microanalysis, 21. 1263-1264 doi:10.1017/s1431927615007102

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Reference TypeJournal (article/letter/editorial)
TitleAn Analytical Scattering Model for Low Energy Annular Dark Field Transmission Scanning Electron Microscopy
JournalMicroscopy and Microanalysis
AuthorsWoehl, TaylorAuthor
Holm, JasonAuthor
Keller, RobertAuthor
Year2015 (August)Volume21
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927615007102Search in ResearchGate
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Mindat Ref. ID4872853Long-form Identifiermindat:1:5:4872853:7
GUID0
Full ReferenceWoehl, Taylor, Holm, Jason, Keller, Robert (2015) An Analytical Scattering Model for Low Energy Annular Dark Field Transmission Scanning Electron Microscopy. Microscopy and Microanalysis, 21. 1263-1264 doi:10.1017/s1431927615007102
Plain TextWoehl, Taylor, Holm, Jason, Keller, Robert (2015) An Analytical Scattering Model for Low Energy Annular Dark Field Transmission Scanning Electron Microscopy. Microscopy and Microanalysis, 21. 1263-1264 doi:10.1017/s1431927615007102
In(2015) Microscopy and Microanalysis Vol. 21. Cambridge University Press (CUP)

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Holm, Jason, Keller, Robert (2015) Analytical Transmission Scanning Electron Microscopy: Extending the Capabilities of a Conventional SEM Using an Off-the-Shelf Transmission Detector. Microscopy and Microanalysis, 21. 1867-1868 doi:10.1017/s1431927615010119
Woehl, Taylor J., White, Ryan M., Keller, Robert R. (2016) Dark-Field Scanning Transmission Ion Microscopy via Detection of Forward-Scattered Helium Ions with a Microchannel Plate. Microscopy and Microanalysis, 22 (3). 544-550 doi:10.1017/s1431927616000775
Keller, Robert R. (2017) 2015 NIST Workshop on Analytical Transmission Scanning Electron Microscopy. Microscopy and Microanalysis, 23. 598-599 doi:10.1017/s1431927617003671
Woehl, Taylor, Keller, Robert (2016) Dark-field image contrast in transmission scanning electron microscopy: Effects of substrate thickness and detector collection angle. Ultramicroscopy, 171. 166-176 doi:10.1016/j.ultramic.2016.08.008
Patel, Binay, Watanabe, Masashi (2014) An Inexpensive Approach for Bright-Field and Dark-Field Imaging by Scanning Transmission Electron Microscopy in Scanning Electron Microscopy. Microscopy and Microanalysis, 20 (1). 124-132 doi:10.1017/s1431927613014049
Schamp, C.T., Hung, P.Y., Min, B.G. (2012) An Efficient Technique to Quantify Dislocation Densities Imaged Through Annular Dark Field Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 18. 1038-1039 doi:10.1017/s1431927612007040
Takeguchi, M, Hashimoto, A, Mitsuishi, K, Shimojo, M (2009) Development of Annular Dark Field Confocal Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 15. 612-613 doi:10.1017/s1431927609093684
Wang, Jinguo, Lu, Ning, Pablo Oviedo, Juan, Peng, Xin, Lian, Guoda, Kim, Moon J. (2015) Aberration Corrected High Angle Annular Dark Field (HAADF) Scanning Transmission Electron Microscopy (STEM) and In Situ Transmission Electron Microscopy (TEM) Study of Transition Metal Dichalcogenides (TMDs). Microscopy and Microanalysis, 21. 431-432 doi:10.1017/s1431927615002950
Findlay, Scott D. (2015) Annular Bright Field Scanning Transmission Electron Microscopy - Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials. Microscopy and Microanalysis, 21. 1939-1940 doi:10.1017/s1431927615010478
Caplins, Benjamin W., Holm, Jason D., Keller, Robert R. (2018) Developing a Programmable STEM Detector for the Scanning Electron Microscope. Microscopy and Microanalysis, 24. 658-659 doi:10.1017/s1431927618003781
Dutta, A., Reid, C., Heinrich, H. (2013) Simulation of Incoherent Scattering in High-Angle Annular Dark-Field Scanning Electron Microscopy. Microscopy and Microanalysis, 19. 852-853 doi:10.1017/s1431927613006259
 
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