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Wang, Jinguo, Lu, Ning, Pablo Oviedo, Juan, Peng, Xin, Lian, Guoda, Kim, Moon J. (2015) Aberration Corrected High Angle Annular Dark Field (HAADF) Scanning Transmission Electron Microscopy (STEM) and In Situ Transmission Electron Microscopy (TEM) Study of Transition Metal Dichalcogenides (TMDs). Microscopy and Microanalysis, 21. 431-432 doi:10.1017/s1431927615002950

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Reference TypeJournal (article/letter/editorial)
TitleAberration Corrected High Angle Annular Dark Field (HAADF) Scanning Transmission Electron Microscopy (STEM) and In Situ Transmission Electron Microscopy (TEM) Study of Transition Metal Dichalcogenides (TMDs)
JournalMicroscopy and Microanalysis
AuthorsWang, JinguoAuthor
Lu, NingAuthor
Pablo Oviedo, JuanAuthor
Peng, XinAuthor
Lian, GuodaAuthor
Kim, Moon J.Author
Year2015 (August)Volume21
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927615002950Search in ResearchGate
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Mindat Ref. ID4871508Long-form Identifiermindat:1:5:4871508:3
GUID0
Full ReferenceWang, Jinguo, Lu, Ning, Pablo Oviedo, Juan, Peng, Xin, Lian, Guoda, Kim, Moon J. (2015) Aberration Corrected High Angle Annular Dark Field (HAADF) Scanning Transmission Electron Microscopy (STEM) and In Situ Transmission Electron Microscopy (TEM) Study of Transition Metal Dichalcogenides (TMDs). Microscopy and Microanalysis, 21. 431-432 doi:10.1017/s1431927615002950
Plain TextWang, Jinguo, Lu, Ning, Pablo Oviedo, Juan, Peng, Xin, Lian, Guoda, Kim, Moon J. (2015) Aberration Corrected High Angle Annular Dark Field (HAADF) Scanning Transmission Electron Microscopy (STEM) and In Situ Transmission Electron Microscopy (TEM) Study of Transition Metal Dichalcogenides (TMDs). Microscopy and Microanalysis, 21. 431-432 doi:10.1017/s1431927615002950
In(2015) Microscopy and Microanalysis Vol. 21. Cambridge University Press (CUP)

See Also

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Lu, Ning, Wang, Jinguo, Oviedo, Juan Pablo, Lian, Guoda, Kim, Moon Jea (2015) Atomic Resolution Scanning Transmission Electron Microscopy of Two-Dimensional Layered Transition Metal Dichalcogenides. Applied Microscopy, 45. 225-229 doi:10.9729/am.2015.45.4.225
Wang, Jinguo, Lian, Guoda, Kim, Moon J. (2018) Probing Nanoscale Local Lattice Strains in Semiconductor Nanostructures and Devices by Transmission Electron Microscopy. Microscopy and Microanalysis, 24. 972-973 doi:10.1017/s1431927618005354
Oxley, M, Benthem, K van, Peng, Y, Pennycook, S (2007) Image Contrast in High Resolution Aberration Corrected Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 13. doi:10.1017/s1431927607076428
Wang, Jinguo, Lu, Ning, Xia, Younan, Kim, Moon J. (2017) Aberration-Corrected STEM Study of Shape Controlled Metallic Core-Shell Nanoparticles for Catalytic Applications. Microscopy and Microanalysis, 23. 1852-1853 doi:10.1017/s1431927617009928
Woehl, Taylor, Holm, Jason, Keller, Robert (2015) An Analytical Scattering Model for Low Energy Annular Dark Field Transmission Scanning Electron Microscopy. Microscopy and Microanalysis, 21. 1263-1264 doi:10.1017/s1431927615007102
Loos, Joachim, Sourty, Erwan, Lu, Kangbo, de With, Gijsbertus, v. Bavel, Svetlana (2009) Imaging Polymer Systems with High-Angle Annular Dark Field Scanning Transmission Electron Microscopy (HAADF−STEM). Macromolecules, 42. 2581-2586 doi:10.1021/ma8026589
Xin, HL, Intaraprasonk, V, Muller, DA (2007) Depth Sectioning of Individual Dopant Atoms with Aberration-Corrected Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 13. doi:10.1017/s1431927607073631
Liu, J, Allard, LF (2009) Imaging ZnO Nanobelts and Nanobelt Supported Metal Nanocatalysts by Aberration-corrected Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 15. 1486-1487 doi:10.1017/s1431927609098286
Yuan, B, Heinrich, H, Yao, B, Dutta, A (2010) Quantitative Measurement of Volumes for Nanoparticles by High-Angle Annular Dark-Field Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 16. 1764-1765 doi:10.1017/s1431927610056825
Liu, J. (2013) Single Atom and Cluster Catalysis: The Era of Aberration-corrected Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 19. 1678-1679 doi:10.1017/s1431927613010386
Lu, K., Sourty, E., Loos, J. (2010) Annular dark-field scanning transmission electron microscopy (ADF-STEM) tomography of polymer systems. Journal of Electron Microscopy, 59. doi:10.1093/jmicro/dfq048
 
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