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Meier, Douglas C., Davis, Jeffrey M., Vicenzi, Edward P. (2011) An Examination of Kernite (Na2B4O6(OH)2·3H2O) Using X-Ray and Electron Spectroscopies: Quantitative Microanalysis of a Hydrated Low-Z Mineral. Microscopy and Microanalysis, 17 (5) 718-727 doi:10.1017/s1431927611000602

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Reference TypeJournal (article/letter/editorial)
TitleAn Examination of Kernite (Na2B4O6(OH)2·3H2O) Using X-Ray and Electron Spectroscopies: Quantitative Microanalysis of a Hydrated Low-Z Mineral
JournalMicroscopy and Microanalysis
AuthorsMeier, Douglas C.Author
Davis, Jeffrey M.Author
Vicenzi, Edward P.Author
Year2011 (October)Volume17
Page(s)718-727Issue5
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927611000602Search in ResearchGate
Classification
Not set
LoC
Not set
Mindat Ref. ID4857660Long-form Identifiermindat:1:5:4857660:6
GUIDfe5a26d6-f883-403f-b425-862ced21e799
Full ReferenceMeier, Douglas C., Davis, Jeffrey M., Vicenzi, Edward P. (2011) An Examination of Kernite (Na2B4O6(OH)2·3H2O) Using X-Ray and Electron Spectroscopies: Quantitative Microanalysis of a Hydrated Low-Z Mineral. Microscopy and Microanalysis, 17 (5) 718-727 doi:10.1017/s1431927611000602
Plain TextMeier, Douglas C., Davis, Jeffrey M., Vicenzi, Edward P. (2011) An Examination of Kernite (Na2B4O6(OH)2·3H2O) Using X-Ray and Electron Spectroscopies: Quantitative Microanalysis of a Hydrated Low-Z Mineral. Microscopy and Microanalysis, 17 (5) 718-727 doi:10.1017/s1431927611000602
In(2011, October) Microscopy and Microanalysis Vol. 17 (5) Cambridge University Press (CUP)
Abstract/NotesMineral borates, the primary industrial source of boron, are found in a large variety of compositions. One such source, kernite (Na2B4O6(OH)2·3H2O), offers an array of challenges for traditional electron-probe microanalysis (EPMA)—it is hygroscopic, an electrical insulator, composed entirely of light elements, and sensitive to both low pressures and the electron beam. However, the approximate stoichiometric composition of kernite can be analyzed with careful preparation, proper selection of reference materials, and attention to the details of quantification procedures, including correction for the time dependency of the sodium X-ray signal. Moreover, a reasonable estimation of the mineral's water content can also be made by comparing the measured oxygen to the calculated stoichiometric oxygen content. X-ray diffraction, variable-pressure electron imaging, and visual inspection elucidate the structural consequences of high vacuum treatment of kernite, while Auger electron spectroscopy and X-ray photoelectron spectroscopy confirm electron beam-driven migration of sodium and oxygen out of the near-surface region (sampling depth ≈ 2 nm). These surface effects are insufficiently large to significantly affect the EPMA results (sampling depth ≈ 400 nm at 5 keV).

References Listed

These are the references the publisher has listed as being connected to the article. Please check the article itself for the full list of references which may differ. Not all references are currently linkable within the Digital Library.

Pouchou (1984) La Récherche Aerospatiale Un nouveau modèle de calcul pour la microanalyse quantitative par spectrométrie de rayons X—Partie I: Application à l'analyse d'échantillons homogènes 3, 167
Nash (1992) Am Mineral Analysis of oxygen with the electron microprobe: Applications to hydrated glass and minerals 77, 453
SRM 660b. (2010). NIST SRM 660b—Line position and line shape, standard for powder diffraction. Gaithersburg, MD: National Institute of Standards and Technology.
Senior L.A. & Sloto R.A. (2006). Arsenic, boron, and fluoride in ground water in and near diabase intrusions, Newark Basin, southeastern Pennsylvania. USGS Scientific Investigations Report 2006-5261. Reston, VA: U.S. Geological Survey.
Kreiner (2008) Sci Technol Adv Mater Superconductivity in heavily boron-doped silicon carbide 9
Not Yet Imported: - book : 10.1007/978-1-4615-0215-9

If you would like this item imported into the Digital Library, please contact us quoting Book ID 9781461349693
Cooper (1973) Am Mineral Electron population analysis of accurate diffraction data. V. Structure and one-center charge refinement of the light-atom mineral kernite, Na2B4O6(OH)2·3H2O 58, 21
Not Yet Imported: Superconductor Science and Technology - journal-article : 10.1088/0953-2048/21/7/073001

If you would like this item imported into the Digital Library, please contact us quoting Journal ID 76617
Sallay S.I. (1980). Process for producing boron compounds from borate ores. United States Patent #4196177.
Not Yet Imported: Boron - book-chapter : 10.1515/9781501509223-004

If you would like this item imported into the Digital Library, please contact us quoting Journal ID
ISO/TR 22335:2007. (2007). Surface chemical analysis—Depth profiling—Measurement of sputtering rate: Mesh-replica method using a mechanical stylus profilometer. Geneva, Switzerland: International Organization for Standardization.
Not Yet Imported: - book : 10.1515/9781501509223

If you would like this item imported into the Digital Library, please contact us quoting Book ID 9781501509223
Not Yet Imported: Journal of Electron Spectroscopy and Related Phenomena - journal-article : 10.1016/j.elspec.2009.03.021

If you would like this item imported into the Digital Library, please contact us quoting Journal ID 41359
Garrett (1998) Borates: Handbook of Deposits, Processing, Properties, and Use
Davis (1976) Handbook of Auger Electron Spectroscopy
(2008) Chem Eng News Making borosilicate nanoparticles is now possible 86, 34
Not Yet Imported: - book : 10.1002/0471790281

If you would like this item imported into the Digital Library, please contact us quoting Journal ID
Not Yet Imported: Boron - book-chapter : 10.1515/9781501509223-017

If you would like this item imported into the Digital Library, please contact us quoting Journal ID
Rickwood (1981) Am Mineral The largest crystals 66, 885

Map of Localities

Mineral Occurrences

LocalityMineral(s)
Rio Tinto Borax Mine, Kramer Borate deposit, Boron, Kern County, California, USA Kernite


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