Vicenzi, Edward P., Lam, Thomas (2019) Examination of Heritage and Geological Materials Using Correlated Electron- and X-ray-Beam Microanalysis in the SEM. Microscopy and Microanalysis, 25. 2482-2483 doi:10.1017/s143192761901314x
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Examination of Heritage and Geological Materials Using Correlated Electron- and X-ray-Beam Microanalysis in the SEM | ||
Journal | Microscopy and Microanalysis | ||
Authors | Vicenzi, Edward P. | Author | |
Lam, Thomas | Author | ||
Year | 2019 (August) | Volume | 25 |
Page(s) | 2482-2483 | ||
Publisher | Cambridge University Press (CUP) | ||
DOI | doi:10.1017/s143192761901314xSearch in ResearchGate | ||
Mindat Ref. ID | 4888281 | Long-form Identifier | mindat:1:5:4888281:7 |
GUID | c915af57-c7ec-41a2-99b4-ba7f679a5561 | ||
Full Reference | Vicenzi, Edward P., Lam, Thomas (2019) Examination of Heritage and Geological Materials Using Correlated Electron- and X-ray-Beam Microanalysis in the SEM. Microscopy and Microanalysis, 25. 2482-2483 doi:10.1017/s143192761901314x | ||
Plain Text | Vicenzi, Edward P., Lam, Thomas (2019) Examination of Heritage and Geological Materials Using Correlated Electron- and X-ray-Beam Microanalysis in the SEM. Microscopy and Microanalysis, 25. 2482-2483 doi:10.1017/s143192761901314x | ||
In | (2019) Microscopy and Microanalysis Vol. 25. Cambridge University Press (CUP) |
References Listed
These are the references the publisher has listed as being connected to the article. Please check the article itself for the full list of references which may differ. Not all references are currently linkable within the Digital Library.
Hawkes (2017) Advances in Imaging and Electron Physics , 1 | |
Haschke (2014) Laboratory Micro-X-Ray Fluorescence Spectroscopy , 356 | |
Buchwald (1989) American Mineralogist 74, 656 | |
The authors gratefully acknowledge materials received from the reference collection of the National Museum of the American Indian, Smithsonian Institution. |
See Also
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