Meier, D, Davis, J, Konicek, A, Vicenzi, E, Wight, S (2011) X-Ray Microanalysis of Boron Compounds: Approaches to Measuring Low-Z Materials. Microscopy and Microanalysis, 17. 592-593 doi:10.1017/s1431927611003837
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | X-Ray Microanalysis of Boron Compounds: Approaches to Measuring Low-Z Materials | ||
Journal | Microscopy and Microanalysis | ||
Authors | Meier, D | Author | |
Davis, J | Author | ||
Konicek, A | Author | ||
Vicenzi, E | Author | ||
Wight, S | Author | ||
Year | 2011 (July) | Volume | 17 |
Page(s) | 592-593 | ||
Publisher | Cambridge University Press (CUP) | ||
DOI | doi:10.1017/s1431927611003837Search in ResearchGate | ||
Mindat Ref. ID | 4855090 | Long-form Identifier | mindat:1:5:4855090:9 |
GUID | 2785128b-17d8-4219-acbb-09638102e7a3 | ||
Full Reference | Meier, D, Davis, J, Konicek, A, Vicenzi, E, Wight, S (2011) X-Ray Microanalysis of Boron Compounds: Approaches to Measuring Low-Z Materials. Microscopy and Microanalysis, 17. 592-593 doi:10.1017/s1431927611003837 | ||
Plain Text | Meier, D, Davis, J, Konicek, A, Vicenzi, E, Wight, S (2011) X-Ray Microanalysis of Boron Compounds: Approaches to Measuring Low-Z Materials. Microscopy and Microanalysis, 17. 592-593 doi:10.1017/s1431927611003837 | ||
In | (2011) Microscopy and Microanalysis Vol. 17. Cambridge University Press (CUP) |
See Also
These are possibly similar items as determined by title/reference text matching only.